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6 research outputs found
125 years of metal-semiconductor contacts: Where do we stand?
Author
A.H. Wilson
A.I. Bastys
+27Â more
A.M. Cowley
E. Wasserstrom
E.H. Rhoderick
F. Braun
G. Constantinidis
H. Schweickert
H.-J. Im
I. Ohdomari
J. Bardeen
K. Maeda
K.J. Schön
N.F. Mott
P. Werner
R.F. Schmitsdorf
R.F. Schmitsdorf
R.F. Schmitsdorf
R.T. Tung
T.P. Chen
V. Heine
V. Khemka
V.W.L. Chin
W. Mönch
W. Mönch
W. Mönch
W. Schottky
W. Schottky
W. Schottky
Publication venue
'Springer Science and Business Media LLC'
Publication date
01/01/1999
Field of study
No full text
Crossref
Silver schottky contacts on Si(111)? H-(1�1) surfaces prepared by wet-chemical etching
Author
A. Stockhausen
D. Cherns
+22Â more
D.E. Aspnes
G.S. Higashi
H. Hong
J.R. Waldrop
J.R. Waldrop
K. Fukutani
K. Takayanagi
M. Grundner
M. Tsunoda
M. Wittmer
N. Takagi
R. F. Schmitsdorf
R.F. Schmitsdorf
R.T. Tung
S. Chang
T. U. Kampen
V. Heine
W. Mönch
W. M�nch
W.E. Spicer
Y. Iwata
Y.J. Chabal
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref
Improved Ni Schottky Contacts on n-Type 4H-SiC Using Thermal Processing
Author
A. C. Ahyi
A. Itoh
+29Â more
A. Ohi
C.I. Harris
D.K. Schroder
D.M. Martin
E.H. Rhoderick
F. La Via
F. Roccaforte
F. Roccaforte
J. R. Williams
J.A. Cooper
K.J. Schoen
L. Porter
M. Barlow
M. Holz
M. Sochacki
M.O. Aboelfotoh
R. Singh
R.F. Schmitsdorf
R.F. Schmitsdorf
S. Huang
S.M. Sze
S.Y. Han
T. Isaacs-Smith
T. L. Sung
T. N. Oder
W. Mönch
X. Ma
Y. Cao
Y.A. Goldberg
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref
Correlation between barrier height and interface structure of Schottky diodes
Author
Cherns
Chou
+32Â more
Feidenhans'l
Grundner
Heine
Heinemann
Heslinga
Higashi
Hong
Ihm
Lepselter
Louie
Louie
Louis
Ludeke
Mönch
Mönch
Mönch
Mönch
Pauling
Pietsch
R.F. Schmitsdorf
Rhoderick
Sullivan
Sze
T.U. Kampen
Takayanagi
Tung
Tung
Tung
Vrijmoeth
W. Mönch
Weitering
Yeh
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
Crossref
Electrical characteristics of schottky barriers on 4H-SiC: The effects of barrier height nonuniformity
Author
A.Y.C. Yu
B. J. Skromme
+27Â more
C. E. Weitzel
C.-T. Sah
C.E. Weitzel
C.R. Crowell
D. Alok
D. Defives
D. Ganser
D.B. Holt
E. Luckowski
E.H. Rhoderick
F.A. Padovani
H.C. Card
J.M. Gibson
J.R. Sullivan
K. Moore
L.F. Wagner
M. Bhatnagar
M. Bhatnagar
P.G. Neudeck
P.G. Neudeck
P.G. Neudeck
R.F. Schmitsdorf
R.T. Tung
T. Gehoski
T. Kimoto
W.J. Schaffer
W.L. Zhou
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref
The barrier-height inhomogeneity in identically prepared Ni/n-type 6H-SiC Schottky diodes
Author
A. Olbrich
A. Türüt
+36Â more
B. Gürbulak
C. Detavernier
C.F. Piri
E.H. Rhoderick
F. Giannazzo
G.M. Vanalme
H. Cetin
H.-J. Im
H.H. Weitering
J.H. Werner
J.P. Sullivan
J.R. Waldrop
M. Biber
M. Mehregany
M.O. Aboelfotoh
P. Liaw
R.F. Schmitsdorf
R.T. Tung
R.T. Tung
R.T. Tung
S. Anand
S. Chand
S. Dogan
S. Dogan
S. Dogan
S. Duman
T. Manago
T.-H. Gil
T.U. Kampen
V. Saxena
W. Mönch
W. Mönch
W. Mönch
W.P. Leroy
Y.P. Song
Z.J. Horvath
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
Crossref