Curing behavior of a UV‐curable inkjet ink: distinction between surface‐cure and deep‐cure performance

Safety requirements and the need of low‐migration UV inks have received increasing attention in the packaging industry. Crucial for the development and design of low‐migration UV inkjet inks for migration‐sensitive applications is the polymerization degree. In this study, curing‐behavior of a black, high purity packaging ink (HPP‐ink) was monitored using ATR‐FTIR spectroscopy. UV irradiation of HPP‐ink led to changes in specific absorption bands of the FTIR spectra due to crosslinking reaction of double bonds. Changes in absorptions bands at 1,408 and 1,321 cm−1 permitted the determination of CC conversion of acrylic and vinyl double bond, independently of one another. In addition, a method was developed which allows the investigation of surface‐cure and deep‐cure behavior, separately

Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples

In addition to structural information, detailed knowledge of the local chemical environment proves to be of ever greater importance, for example for the development of new types of materials as well as for specific modifications of surfaces and interfaces in multiple fields of materials science, or various biomedical and chemical applications. But the ongoing miniaturization, and therefore, reduction of the amount of material available for analysis constitute a challenge to the detection limits of analytical methods. In the case of time-of-flight secondary ion mass spectrometry (TOF-SIMS), several methods of secondaryion yield enhancement have been proposed. This article focuses on the investigation of the effects of two of these methods, metal-assisted SIMS and polyatomic primary ion (PI) bombardment. For this purpose, thicker layers of organic molecules (polymers and dyes), both pristine, and metallized with different amounts of gold, were analyzed using monoatomic (Ar+, Ga+, Xe+, Bi+) and polyatomic (SF5+, Bi-3(+), C-60(+)) Pis. It was found that polyatomic ions generally induce a significant increase of the secondary ion yield. On the other hand, with gold deposition, a yield enhancement can only be detected for monoatomic ion bombardment. Copyright (c) 2008 John Wiley & Sons, Ltd

Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

In addition to structural information, a detailed knowledge of the local chemical environment proves to be of ever greater importance, for example for the development of new types of materials as well as for specific modifications of surfaces and interfaces in multiple fields of materials science or various biomedical and chemical applications. But the ongoing miniaturization and therefore reduction of the amount of material available for analysis constitute a challenge to the detection limits of analytical methods. In the case of time-of-flight secondary ion mass spectrometry (TOF-SIMS), several methods of secondary ion yield enhancement have been proposed. This paper focuses on the investigation of the effects of two of these methods, metal-assisted SIMS and polyatomic primary ion bombardment. For this purpose, thicker layers of polystyrene (PS), both pristine and metallized with different amounts of gold, were analyzed usingmonoatomic (Ar+, Ga+, Xe+, Bi+) and polyatomic (SF5+, Bi-3(+), C-60(+)) primary ions. It was found that polyatomic ions generally induce a significant increase of the secondary ion yield. On the other hand, with gold deposition, a yield enhancement can only be detected formonoatomic ion bombardment. (C) 2008 Elsevier B. V. All rights reserved