13 research outputs found
SPUTTER DEPTH PROFILING OF OPTICAL WAVEGUIDES USING SECONDARY ION MASS SPECTROMETRY
The technique of sputter depth profiling by means of secondary ion mass spectrometry
of samples with high resistivity is reviewed. As examples we discuss optical waveguides made
in lithium niobate by titanium indiffusion and implantation and also yttrium iron garnet
waveguides grown by liquid phase epitaxy on gadolinium gallium garnet. Depth profiling of
these waveguide structures has been performed and the necessary precautions to prevent
charging by the primary ion beam are discussed. In some cases, coating with a metallic layer
is adequate, but a more universal method is charge neutralization by an additional electron
beam
System zur Verbesserung der Umweltqualitaet von Dachablaufwaessern Abschlussbericht
SIGLEAvailable from TIB Hannover: F01B37 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekDeutsche Bundesstiftung Umwelt, Osnabrueck (Germany)DEGerman
XAS Investigations on the Iron-Zinc Center of Purple Acid Phosphatase from Red Kidney Beans
XAS Investigations on the Iron-Zinc Center of Purple Acid Phosphatase from Red Kidney Beans
The Amino Acid Sequence of the Red Kidney Bean Fe(III)-Zn(II) Purple Acid Phosphatase. Determination of the Amino Acid Sequence by a Combination of Matrix-Assisted Laser Desorption/Ionization Mass Spectrometry and Automated Edman Sequencing
General corrosion of copper in domestic drinking water installations: Scientific background and mechanistic understanding
10.1179/174327806X94009Corrosion Engineering Science and Technology41121-2