Practical application of Emotional Freedom Techniques for food cravings

Emotional Freedom Techniques (EFT) has been shown to have a lasting effect on food cravings, power over food and restraint ability, and ultimately results in weight loss. This paper discusses the approach utilised in a recent food craving clinical treatment trial (Stapleton, Sheldon, & Porter, 2012; Stapleton, Sheldon, Porter, & Whitty, 2011), and highlights the case of a single participant. Sessions are described in detail and specific recommendations are made for the application of EFT to food cravings in overweight and obese individuals.Full Tex

Effectiveness of speech intervention methods in children with speech delays

Speech delays in children is a common issue that can be treated by a wide variety of interventions. Our PICOT question is, in children, ages six months to thirteen years, with speech/language delays, how does the addition of innovative and supplemental interventions, compared with standard interventions alone, effect improvements in the delays. All three group members have known someone who has suffered from a speech delay, and we want to research the best possible methods to overcome that obstacle to answer our questions, we will begin to take on the task of creating and writing a systematic review. This review will include selecting, reviewing, and critically appraising a minimum of twenty primary, scientific and/or academic research articles on different speech interventions that have been utilized to help children overcome their speech delays. We are looking forward to going on this adventure of completing our very first official research project It is something that will be challenging but help us grow in our education and assist in making us better and well-rounded students

Layer-Resolved Ultrafast XUV Measurement of Hole Transport in a Ni-TiO2-Si Photoanode

Metal-oxide-semiconductor junctions are central to most electronic and optoelectronic devices. Here, the element-specificity of broadband extreme ultraviolet (XUV) ultrafast pulses is used to measure the charge transport and recombination kinetics in each layer of a Ni-TiO2-Si junction. After photoexcitation of silicon, holes are inferred to transport from Si to Ni ballistically in ~100 fs, resulting in spectral shifts in the Ni M2,3 XUV edge that are characteristic of holes and the absence of holes initially in TiO2. Meanwhile, the electrons are observed to remain on Si. After picoseconds, the transient hole population on Ni is observed to back-diffuse through the TiO2, shifting the Ti spectrum to higher oxidation state, followed by electron-hole recombination at the Si-TiO2 interface and in the Si bulk. Electrical properties, such as the hole diffusion constant in TiO2 and the initial hole mobility in Si, are fit from these transient spectra and match well with values reported previously