2 research outputs found
Silver Diffusion in Organic Optoelectronic Devices: Deposition-Related Processes versus Secondary Ion Mass Spectrometry Analysis Artifacts
The
development of organic optoelectronic devices relies on controlling
interfaces during thin-film deposition and requires an accurate characterization
of the film composition at these interfaces. Dynamic secondary ion
mass spectrometry (SIMS) is widely used to investigate multilayer
thin-film structures. Routine analysis protocols are well established
for classical semiconductor samples, but for organic or mixed metallic–organic
samples the limitations of
the technique are less well established. In the current work, low-energy
dynamic SIMS is used on metal–organic multilayered model structures
similar to those in organic optoelectronic devices to study the origin
of diffusion of metal into the organic layer (e.g., irradiation-induced
diffusion during SIMS analysis or during the deposition process).
Samples contain silver and organic compounds sequentially deposited
by thermal evaporation in vacuum onto a Si substrate. They are analyzed
using a 250 eV to 1 keV Cs<sup>+</sup> primary ion beam. It is found
that the mixing of silver into the organic layer depends on the impact
energy and the conditions for sample preparation. This irradiation
effect can be minimized by a back-side depth profiling approach, which
was developed in this work. By applying this method, it is shown that
some silver is likely to diffuse into the organic layers during the
deposition process
Additional file 1: Figure S1. of Use of next generation sequencing data to develop a qPCR method for specific detection of EU-unauthorized genetically modified Bacillus subtilis overproducing riboflavin
Sequence of B. subtilis subsp. subtilis str. 168 genome sequence [Genbank:CP010052.1] corresponding to the region containing part of Contig00019 and Contig00022. There is a gap of 37 basepairs (uncoloured region in the figure) between Contig00019 (pink region in figure) and Contig00022 (yellow region in figure), when aligning the obtained contigs to B. subtilis subsp. subtilis str. 168 genome sequence [Genbank:CP010052.1]. PCR and sequence analysis were used to confirm that the genomic regions present on both contigs are indeed adjacent in the GM-Bacillus genome. Hereto, primers Scaf-19-F3-seq (positioned on Contig00019, indicated in green) and Scaf-22-R-seq (positioned on Contig00022, indicated in blue) were used to amplify the flanking regions of the junction between Contig00019 and Contig00022. Subsequently, the obtained PCR fragment was sequenced. (PDF 101 kb