Wavelet Inverse Neutron Scattering Study of Layered Metallic NiC-Ti Composites

Composites are prevalent in high technology devices such as aircraft, computers, automobiles and communications systems. They improve brittleness and provide a lower density which enhances mechanical strength. Electron and light manipulating composites will be used more and more in the future. It is necessary to have a capability of inspecting composites, both to assure production quality and as a baseline for later NDE. In this paper, we present a study using wavelet, inverse neutron optics and the grazing angle neutron spectrometer, GANS, at the Missouri University Research Reactor, MURR

Determination of total x-ray absorption coefficient using non-resonant x-ray emission

An alternative measure of x-ray absorption spectroscopy (XAS) called inverse partial fluorescence yield (IPFY) has recently been developed that is both bulk sensitive and free of saturation effects. Here we show that the angle dependence of IPFY can provide a measure directly proportional to the total x-ray absorption coefficient, µ(E). In contrast, fluorescence yield (FY) and electron yield (EY) spectra are offset and/or distorted from µ(E) by an unknown and difficult to measure amount. Moreover, our measurement can determine µ(E) in absolute units with no free parameters by scaling to µ(E) at the non-resonant emission energy. We demonstrate this technique with measurements on NiO and NdGaO3. Determining µ(E) across edge-steps enables the use of XAS as a non-destructive measure of material composition. In NdGaO3, we also demonstrate the utility of IPFY for insulating samples, where neither EY or FY provide reliable spectra due to sample charging and self-absorption effects, respectively

Orbital reflectometry

The occupation of d-orbitals controls the magnitude and anisotropy of the inter-atomic electron transfer in transition metal oxides and hence exerts a key influence on their chemical bonding and physical properties. Atomic-scale modulations of the orbital occupation at surfaces and interfaces are believed to be responsible for massive variations of the magnetic and transport properties, but could thus far not be probed in a quantitative manner. Here we show that it is possible to derive quantitative, spatially resolved orbital polarization profiles from soft x-ray reflectivity data, without resorting to model calculations. We demonstrate that the method is sensitive enough to resolve differences of 3 % in the occupation of Ni e_g orbitals in adjacent atomic layers of a LaNiO3-LaAlO3 superlattice, in good agreement with ab-initio electronic-structure calculations. The possibility to quantitatively correlate theory and experiment on the atomic scale opens up many new perspectives for orbital physics in d-electron materials

X-ray diffuse scattering as a probe for thin film and interface structure

The structure of thin films and interfaces can be probed by X-ray specular and off-specular (diffuse) scattering. As is well-known, the former yields the average density profile across the film or interface. Diffuse scattering as treated here is the analogue (for interfaces) of small-angle scattering from bulk materials, but with the ability to probe much larger length-scales. We shall discuss how the diffuse scattering yields information regarding the detailed morphology of the interface roughness, the conformality of the roughness between successive interfaces, the morphology of the erosion or pit-structure shall illustrate with results on several systems studied using synchrotron radiation at the National Synchrotron Light Source.