Structure and Surface Analysis of SHI Irradiated Thin Films of Cadmium Telluride

Cadmium Telluride (CdTe) thin films grown by thermal evaporation on quartz substrates were irradiated with swift (100 MeV) Ni + 4 ions at various fluences in the range 1011 – 1013 cm – 2. The modification in structure and surface morphology has been analyzed as a function of fluence using XRD and AFM techniques. The XRD showed a reduction in peak intensity and grain size with increasing fluence. The AFM micrographs of irradiated thin films show small spherical nanostructures. In addition to direct imaging, AFM profile data enable to derive the Power Spectral Density (PSD) of the surface roughness. In the present work PSD spectra computed from AFM data were used for studying the surface morphology of films. The PSD curves were fitted with an appropriate analytic function and characteristic parameters were deduced and discussed in order to compare film morphology with varying fluence levels. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/2960