Fabrication and optical characterization of improved electroless chemically deposited strontium fluoride (SrF2) thin films at 320K

Thin semi conductor films of strontium fluoride (SrF2) were successfully deposited on glass microscope slides using simple and cheap electroless chemical bath deposition methods at 320K and pH values of 9, 10 and 12. Controlled addition of ethylenediamine tetra acetate (EDTA), another complexing agent with pH to oppose that of bath constitutions, was used to vary the deposition pH values. X-ray diffractometry technique was used to confirm the depositions. Absorbance spectra data of the films were obtained by a single bean spectrophotometer (Pharmacia LKB Biochrom 4060) at wavelength range 200 to 900nm. Other optical and solid state properties were calculated from the data and compared with other deposited thin films. Average optical and solid state properties include absorbance ranging from 0.034 to 0.086, transmittance 0.820 to 0.925, reflectance 0.041 to 0.094, refractive index 1.51 to 1.88 absorption coefficient 0.078 to 0.198x 106m)-1 , electrical conductivity 0.40 to 0.49 (ohm cm)-1, film thickness 0.013 to 0.074μm and bandgap 2.55 to 2.75 eV. The deposited thin films could find applications in antireflection coatings for eyeglass, solar thermal control devices and solar cells JONAMP Vol. 11 2007: pp. 415-42

Comparative studies of Cobalt Oxide (CoO) and Copper Oxide (CuO) thin films deposited by improved electroless chemical bath technique at 320K

Semi conducting thin films of cobalt oxide (CoO) and copper oxide (CuO) were successfully deposited on glass slides at 320K and pH values of 7, 9 and 11 by electroless chemical bath deposition method. Ethylenediamine-tetra acetate (EDTA), another complexing agent, with pH oppose that of bath reagents was added to bath constitutions to enhance control and stabilize the deposition bath pH at different values suitable for film deposition. X-ray diffraction method was used to confirm the depositions. Electron micrographs of the films reveal uniform surface depositions. Absorbance (A) spectra data were measured by a single beam spectrophotometer at wavelength range 200nm to 900nm. Other optical and solid state properties were calculated from the data and compared with other deposited thin films. Average optical and solid state properties of CoO thin films include absorbance ranging from 0.051 to 0.212, transmittance 0.614 to 0.889, refractive index 1.64 to 2.43, electrical conductivity 0.43 to 0.58 (ohm-cm)-1, film thickness 0.052 to 0.216μm and band gap 2.36 to 2.75 +0.05eV. For CuO thin films the absorbance ranges from 0.084 to 0.112, transmittance 0.646 to 0.824, refractive index 1.82 to 2.36, electrical conductivity 0.48 to 0.62 (ohm-cm)-1, film thickness 0.003 to 0.051μm and band gap 1.75 to 2.45 +0.05eV. Films with refractive index lower than 1.9 could be used in antireflection coatings, eyeglass coating and solar thermal control coatings. Those with refractive index greater than 1.9 could be useful in construction of poultry houses and anti dazzling coatings. The films could be employed in solar cells. Journal of the Nigerian Association of Mathematical Physics Vol. 9 2005: pp. 519-52

Analysis of Zinc Sulphide (ZnS) and Cadmium Sulphide (CdS) thin films deposited by improved solution growth method at 300K

We successfully deposited good quality semi conducting thin films of zinc sulphide (ZnS) and cadmium sulphide (CdS) on glass slides at 300K and pH values of 8, 10 and 12 by improved solution growth method. Ethylenediamine-tetra acetate (EDTA), another complexing agent, with pH oppose that of bath constitutions was added to bath reagents to enhance control and stabilize the deposition pH at different values suitable for film growth. X-ray diffraction method was used to confirm the depositions. Electron micrographs of the films reveal uniform surface deposition. Absorbance (A) spectra data were measured by a single beam spectrophotometer at wavelength range 200nm to 900nm. Other optical and solid state properties were calculated using the data and compared with other deposited thin films. Average optical and solid state properties of ZnS thin films include absorbance ranging from 0.049 to 0.110, transmittance 0.776 to 0.893, refractive index 1.63 to 2.02, film thickness 0.035 to 0.056μm and band gap 2.30 to 2.62 +0.05eV. For CdS thin films, the absorbance ranges from 0.067 to 0.080, transmittance 0.832 to 0.857, refractive index 1.76 to 1.84, film thickness 0.002 to 0.017μm and band gap 1.62 to 2.25 +0.05eV. Films with refractive index lower than 1.9 could be used in antireflection coatings, eyeglass coating and solar thermal control coatings. Those with refractive index greater than 1.9, could be useful in construction of poultry production, anti dazzling coatings and thin films solar cells. Journal of the Nigerian Association of Mathematical Physics Vol. 9 2005: pp. 529-54