Focusing by Plano-Concave lens using Negative Refraction

We demonstrate focusing of a plane microwave by a plano-concave lens fabricated from a photonic crystal (PhC) having negative refractive index and left-handed electromagnetic properties. An inverse experiment, in which a plane wave is produced from a source placed at the focal point of the lens is also reported. A frequency dependent negative refractive index, is obtained for the lens from the experimental data which matches well with that determined from band structure calculations

Negative Refraction and Left-handed electromagnetism in Microwave Photonic Crystals

We demonstrate negative refraction of microwaves in metallic photonic crystals. The spectral response of the photonic crystal, which manifests both positive and negative refraction, is in complete agreement with band-structure calculations and numerical simulations. The negative refraction observed corresponds to left-handed electromagnetism and arises due to the dispersion characteristics of waves in a periodic medium. This mechanism for negative refraction is different from that in metamaterials.Comment: 13 pages, 4 figure

Microwave properties of superconducting MgB2

Measurements of 10 GHz microwavesurface resistance, Rs, of dense MgB2wire and pellet are reported. Significant improvements are observed in the wire with reduction of porosity. The data lie substantially above the theoretical estimates for a pure Bardeen–Cooper–Schrieffer s-wave superconductor. However, the Rs (20 K) of the wire is an order of magnitude lower than that of polycrystalYBa2Cu3O6.95 and matches with single-crystal YBa2Cu3O6.95. The results show promise for the use of MgB2 in microwave applications

Non-linear microwave impedance of short and long Josephson Junctions

The non-linear dependence on applied $ac$ field ($b_{\omega}$) or current ($i_{\omega}$) of the microwave (ac) impedance $R_{\omega}+iX_{\omega}$ of both short and long Josephson junctions is calculated under a variety of excitation conditions. The dependence on the junction width is studied, for both field symmetric (current anti-symmetric) and field anti-symmetric (current symmetric) excitation configurations.The resistance shows step-like features every time a fluxon (soliton) enters the junction, with a corresponding phase slip seen in the reactance. For finite widths the interference of fluxons leads to some interesting effects which are described. Many of these calculated results are observed in microwave impedance measurements on intrinsic and fabricated Josephson junctions in the high temperature superconductors, and new effects are suggested. When a $$ field ($b_{dc}$) or current ($i_{dc}$) is applied, interesting phase locking effects are observed in the ac impedance $Z_{\omega}$. In particular an almost periodic dependence on the dc bias is seen similar to that observed in microwave experiments at very low dc field bias. These results are generic to all systems with a $\cos (\phi)$ potential in the overdamped limit and subjected to an ac drive.Comment: 7 pages, 11 figure

Onset of dielectric modes at 110K and 60K due to local lattice distortions in non-superconducting YBa_{2}Cu_{3}O_{6.0} crystals

We report the observation of two dielectric transitions at 110K and 60K in the microwave response of non-superconducting YBa_{2}Cu_{3}O_{6.0} crystals. The transitions are characterized by a change in polarizability and presence of loss peaks, associated with overdamped dielectric modes. An explanation is presented in terms of changes in polarizability of the apical O atoms in the Ba-O layer, affected by lattice softening at 110K, due to change in buckling of the Cu-O layer. The onset of another mode at 60K strongly suggests an additional local lattice change at this temperature. Thus microwave dielectric measurements are sensitive indicators of lattice softening which may be relevant to superconductivity.Comment: 5 pages, 3 ps format figure

Material interactions in laser polishing powder bed additive manufactured Ti6Al4V components

Laser polishing (LP) is an emerging technique with the potential to be used for post-build, or in-situ, precision smoothing of rough, fatigue-initiation prone, surfaces of additive manufactured (AM) components. LP uses a laser to re-melt a thin surface layer and smooths the surface by exploiting surface tension effects in the melt pool. However, rapid re-solidification of the melted surface layer and the associated substrate thermal exposure can significantly modify the subsurface material. This study has used an electron beam melted (EBM) Ti6Al4V component, representing the worst case scenario in terms of roughness for a powder bed process, as an example to investigate these issues and evaluate the capability of the LP technique for improving the surface quality of AM parts. Experiments have shown that the surface roughness can be reduced to below Sa = 0.51 μm, which is comparable to a CNC machined surface, and high stress concentrating defects inherited from the AM process were removed by LP. However, the re-melted layer underwent a change in texture, grain structure, and a martensitic transformation, which was subsequently tempered in-situ by repeated beam rastering and resulted in a small increase in sub-surface hardness. In addition, a high level of near-surface tensile residual stresses was generated by the process, although they could be relaxed to near zero by a standard stress relief heat treatment