Critical frequency in nuclear chiral rotation

Within the cranked Skyrme-Hartree-Fock approach the self-consistent solutions have been obtained for planar and chiral rotational bands in 132La. It turns out that the chiral band cannot exist below some critical rotational frequency which in the present case equals omega=0.6MeV. The appearance of the critical frequency is explained in terms of a simple classical model of two gyroscopes coupled to a triaxial rigid body.Comment: 4 RevTeX pages, 6 EPS figure

Studies of aluminum oxide thin films deposited by laser ablation technique

This paper presents the structural and optical investigations of the aluminum oxide nanocrystalline thin films. Investigated films were fabricated by laser ablation technique in high vacuum onto quartz substrates. The films were deposited at two different temperatures of the substrates equal to room temperature and 900 K. X-ray Diffraction spectra proved nanocrystalline character and the corundum phase of the film regardless on the substrate temperature during the deposition process. Values of the refractive indices, extinction and absorption coefficients were calculated by using Transmission and Reflection Spectroscopy in the UV–VIS–NIR range of the wavelength. Coupling Prism Method was used for films thickness estimations. Experimental measurements and theoretical calculations of the Third Harmonic Generation were also reported. Obtained results show that the lattice strain may affect obtained values of the third order nonlinear optical susceptibility

Structural and optical properties of as-grown and annealed Alq3 thin films

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Transparent amorphous zinc oxide thin films for NLO applications

This review focuses on the growth and optical properties of amorphous zinc oxide (ZnO) thin films. A high quality ZnO films fabricated by dip-coating (sol–gel) method were grown on quartz and glass substrates at temperature equal to 350 K. The amorphous nature of the films was verified by X-ray diffraction. Atomic Force Microscopy was used to evaluate the surface morphology of the films. The optical characteristics of amorphous thin films have been investigated in the spectral range 190–1100 nm. Measurement of the polarized optical properties was shows a high transmissivity (80–99%) and low absorptivity (<5%) in the visible and near infrared regions at different angles of incidence. Linear optical properties were investigated by classic and Time-Resolved Photoluminescence (TRPL) measurements. Photoluminescence spectrum exhibits a strong ultraviolet emission while the visible emission is very weak. An innovative TRPL technique has enabled the measurement of the photoluminescence decay time as a function of temperature. TRPL measurements reveal a multiexponential decay behavior typical for amorphous thin films. Second and third harmonic generation measurements were performed by means of the rotational Maker fringe technique using Nd:YAG laser at 1064 nm in picosecond regime for investigations of the nonlinear optical properties. The obtained values of second and third order nonlinear susceptibilities were found to be high enough for the potential applications in the optical switching devices based on refractive index changes. Presented spectra confirm high structural and optical quality of the investigated zinc oxide thin films

Optical and structural characterization of thin films containing metallophthalocyanine chlorides

Abstract The structural and optical investigation of thin films containing aluminum and gallium phthalocyanine chlorides is presented. The films were fabricated by Physical Vapor Deposition technique onto quartz substrates and annealed after fabrication in an ambient atmosphere for 24 h at the temperature equal to 150 °C or 250 °C. The experimental results and theoretical calculation of the Third Harmonic Generation process are reported. The third order nonlinear optical properties are expected and can be more or less accurately predicted due to the assembly of the molecules and theoretical calculations of the frequency-dependent dipole polarizabilities, third hyperpolarizabilities, third order susceptibilities, frontier and second frontier molecular orbitals. These parameters were used to understand the relationship of optical properties with the molecular structures. We found that the annealing process causes formation of nanostructures and the value of the third order optical susceptibility makes these materials interesting for future nonlinear optical applications

Photophysical properties of Alq3 thin films

This work contains investigation results of the photophysical properties of aluminum (III) tris(8-hydroxyquinoline) thin films. The Alq3 thin films were successfully fabricated by Physical Vapor Deposition technique. The films were grown on transparent: (quartz and glass) and semiconductor (n-type silica) substrates kept at room temperature during the deposition process. Selected films were annealed after fabrication in ambient atmosphere for 12 h at the temperature equal to 100 °C and 150 °C. Morphology of the films was investigated by AFM technique. Photophysical properties were characterized via photoluminescence, transmission, second and third harmonic generation measurements. The thin films exhibit high structural quality regardless of the annealing process, but the stability of the film can be improved by using an appropriate temperature during the annealing process. Photoluminescence of Alq3 films obtained in air were efficient and stable. The measurements of transmission, SHG and THG spectra allowed us to determine optical constant of the films. We find that the photophysical properties were strictly connected with the morphology and the annealing process significantly changes the structural properties of the films

Linear and Nonlinear Optical properties of ZnO Thin Films deposited by Pulsed Laser Depositio

This paper presents the structural and optical properties of ZnO thin films deposited by using pulsed laser deposition technique on quartz substrates. The deposition process was carried out at various temperatures of the substrates from room temperature to 825 K in order to investigate these properties of the films and their mutual influence. The structural and morphological properties of the films were investigated by X-Ray Diffraction and Atomic Force Microscopy measurements, respectively. The quality of the films was improved with an increase of the substrate temperature. The linear optical properties of the films were studied by classic and time-resolved photoluminescence spectra in the broad range of the temperature from 13 K to 325 K. Classic photoluminescence measurement allowed us to estimate band gap energy as a function of the temperature. An innovative time-resolved photoluminescence technique lets us precisely measure the decay time in the real time. Results of these measurements reveal a simple exponential decay behavior typical for well oriented crystalline thin films. Presented spectra confirm high structural and linear optical quality of investigated films. The nonlinear optical properties of the films were investigated by Third Harmonic Generation technique. Our results also indicated that the substrate temperature strongly affected nonlinear optical properties and the values of third order nonlinear susceptibilities were found to be high enough for the potential applications in the optical switching devices