A high-resolution micro-electro-mechanical resonant tilt sensor

This paper reports on the design and experimental evaluation of a high-resolution Micro-Electro-Mechanical (MEM) tilt sensor based on resonant sensing principles. The sensors incorporate a pair of double-ended tuning fork (DETF) resonant strain gauges, the mechanical resonant frequencies of which shift in proportion to an axial force induced by variations in the component of gravitational acceleration along a specified input axis. An analysis of the structural design of such sensors (using analytical and finite element modelling) is presented, followed by experimental test results from device prototypes fabricated using a silicon-on-insulator (SOI) MEMS technology. This paper reports measurement conducted to quantify sensor scale factor, temperature sensitivity, scale factor linearity and resolution. It is demonstrated that such sensors provide a ±90 degree dynamic range for tilt measurements with a temperature sensitivity of nearly 500 ppb/K (equating to systematic sensitivity error of approximately 0.007 degree/K). When configured as a tilt sensor, it is also shown that the scale factor linearity is better than 1.4% for a ±20° tilt angle range. The bias stability of a micro-fabricated prototype is below 500 ng for an averaging time of 0.8 seconds making these devices a potentially attractive option for numerous precision tilt sensing applications.This is the author's accepted manuscript. The final version is available from Elsevier at http://www.sciencedirect.com/science/article/pii/S0924424714004385

The effect of mass loading on spurious modes in micro-resonators

Dissipation mechanisms severely compromise the performance of micro-resonator based sensors. In this letter, we specifically examine the shift in resonant frequency of spurious modes towards the mode of interest during mass loading. This can result in modal interaction that degrades the response of the sensor. However, by understanding and controlling this effect we can overcome this key barrier to micro-resonator applications.This is the author accepted manuscript. The final version is available from AIP via http://dx.doi.org/10.1063/1.492759

Numerical Study of the Impact of Vibration Localization on the Motional Resistance of Weakly Coupled MEMS Resonators

This paper presents a numerical study of the impact of process-induced variations on the achievable motional resistance Rx of one-dimensional, two-dimensional, cyclic and cross-coupled architectures of weakly coupled, electrostatically transduced MEMS resonators operating in the 250 kHz range. We use modal analysis to find the Rx of such coupled arrays and express it as a function of the eigenvectors of the specific mode of vibration. Monte Carlo numerical simulations, which accounted for up to 0.75% variation in critical resonator feature sizes, were initiated for different array sizes and coupling strengths, for the four distinct coupling architectures. Improvements in the mean and standard deviation of the generated Rx distributions are reported when the resonators are implemented in a cross-coupled scheme, as opposed to the traditional one-dimensional chain. The two-dimensional coupling scheme proves to be a practical and scalable alternative to weakly coupled one-dimensional chains to improve the immunity to process variations. It is shown that a 75% reduction in both the mean and standard deviation of the Rx is achieved as compared to the traditional one-dimensional chain for a normalized internal coupling k > 10-2.The authors would like to gratefully acknowledge the Qualcomm European Research Studentships in Technology and the UK Engineering and Physical Sciences Research Council.This is the accepted manuscript. The final version is available from IEEE at http://dx.doi.org/10.1109/JMEMS.2014.2371072

Limits to mode-localized sensing using micro- and nanomechanical resonator arrays

In recent years, the concept of utilizing the phenomenon of vibration mode-localization as a paradigm of mechanical sensing has made profound impact in the design and development of highly sensitive micro- and nanomechanical sensors. Unprecedented enhancements in sensor response exceeding three orders of magnitude relative to the more conventional resonant frequency shift based technique have been both theoretically and experimentally demonstrated using this new sensing approach. However, the ultimate limits of detection and in consequence, the minimum attainable resolution in such mode-localized sensors still remain uncertain. This paper aims to fill this gap by investigating the limits to sensitivity enhancement imposed on such sensors, by some of the fundamental physical noise processes, the bandwidth of operation and the noise from the electronic interfacial circuits. Our analyses indicate that such mode-localized sensors offer tremendous potential for highly sensitive mass and stiffness detection with ultimate resolutions that may be orders of magnitude better than most conventional micro- and nanomechanical resonant sensors

Mode-localized displacement sensing

We report the construction of a new class of micromachined displacement sensors that employ the phenomenon of vibration-mode localization for monitoring minute inertial displacements. It is demonstrated both theoretically and experimentally that the eigenstate-shifted output signal of such mode-localized displacement sensors may be as high as 1000 times greater than corresponding resonant-frequency variations that serve as the output in the more traditional vibratory resonant micromechanical displacement/motion sensors. The high parametric sensitivities attainable in such mode-localized displacement sensors, together with their inherent advantages of improved environmental robustness and electrical tunability, suggest an alternative approach in achieving improved sensitivity and stability in high-resolution displacement transduction. © 1992-2012 IEEE

Micro-electro-mechanical resonant tilt sensor with 250 nano-radian resolution

This paper reports a high-resolution frequency-output MEMS tilt sensor based on resonant sensing principles. The tilt sensor measures orientation by sensing the component of gravitational acceleration along a specified input axis. A combination of design enhancements enables significantly higher sensitivity for this device as compared to previously reported prototype sensors. The MEMS tilt sensor is calibrated on a manual tilt table over tilt angles ranging over 0-90 degrees with a relatively linear response measured in the range of ±20°(linearity error <2.3%) with a scale factor of approximately 50.06 Hz/degree. The noise-limited resolution of the sensor is found to be approximately 250 nano-radians for an integration time of 0.8 s, which is over an order of magnitude better than previously reported results [1]. © 2013 IEEE