A Centralized Mechanism to Make Predictions Based on Data From Multiple WSNs

In this work, we present a method that exploits a scenario with inter-Wireless Sensor Networks (WSNs) information exchange by making predictions and adapting the workload of a WSN according to their outcomes. We show the feasibility of an approach that intelligently utilizes information produced by other WSNs that may or not belong to the same administrative domain. To illustrate how the predictions using data from external WSNs can be utilized, a specific use-case is considered, where the operation of a WSN measuring relative humidity is optimized using the data obtained from a WSN measuring temperature. Based on a dedicated performance score, the simulation results show that this new approach can find the optimal operating point associated to the trade-off between energy consumption and quality of measurements. Moreover, we outline the additional challenges that need to be overcome, and draw conclusions to guide the future work in this field.Comment: 10 pages, simulation results and figures. Published i

The intron-containing gene for yeast profilin (PFY) encodes a vital function

The gene coding for profilin (PFY), an actin-binding protein, occurs as a single copy in the haploid genome of Saccharomyces cerevisiae and is required for spore germination and cell viability. Displacement of one gene copy in a diploid cell by a nonfunctional allele is recessively lethal: tetrad analysis yields only two viable spores per ascus. The PFY gene maps on chromosome XV and is linked to the ADE2 marker. The primary transcript of about 1,000 bases contains an intron of 209 bases and is spliced into a messenger of about 750 bases. The intron was identified by comparison with a cDNA clone, which also revealed the 3' end of the transcript. The 5' end of the mRNA was mapped by primer elongation. The gene is transcribed constitutively and has a coding capacity for a protein of 126 amino acids. The deduced molecular weight o

Materials Analysis by Mass Spectrometry of Sputtered Neutrals

Mass spectrometric detection of neutral surface particles released by ion bombardment has become an important method for surface and depth profile analysis. Its fundamental difference to secondary ion mass spectrometry SIMS is the separation of the formation of the analyzed particles and their ionization. Hence, matrix and selectivity effects influencing SIMS signals in a mostly unknown manner via the ionization process in secondary ion emission are avoided in general. The different techniques being presently employed for the necessary postionization of the sputtered neutrals are reviewed and discussed with respect to their potentialities. Secondary Neutral Mass Spectrometry (SNMS) using efficient postionization by the electron component of a special tow pressure high frequency plasma is the presently most elaborated technique. The quantifiability of SNMS signals is discussed and illustrated by various examples. Depth resolution in the subnanometer range is shown to be obtained with the direct bombardment mode of SNMS in which the sample is bombarded with noble gas ions from the SNMS-plasma at energies in the order of only 102 eV

Chemical surface and thin film analysis in glass coating

After a short overview of recent analytical techniques for compositional surface analysis and the determination of concentration depth profiles, the principle, the Instrumentation and the Performance of the routinely used electron spectroscopic and mass spectrometric methods, namely photo- and Auger electron spectroscopy as well as secondary ion and secondary neutral mass spectrometry, are described. The application of these techniques to electrically insulating surfaces and layer structures is particularly emphasized by corresponding practical examples. Secondary neutral mass spectrometry is specifically addressed with regard to the potentialities of the novel high-frequency mo d e of electron-gas secondary neutral mass spectrometry for quantitative composition analysis and high-resolution depth profiling of electrically nonconducting sample structures

Analysis of Insulator Samples by Secondary Neutral Mass Spectrometry

Secondary Neutral Mass Spectrometry (SNMS) offers new possibilities for the analysis of insulators when the electron component of the postionizing SNMS plasma is employed for a precise compensation of sample charging. The compensation techniques for the three operation modes of SNMS, namely the direct, the separate and the external bombardment mode are described. Corresponding examples for bulk and depth profile analysis of insulating samples and dielectric thin film systems will be reported and discussed