Rrevealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD

Understanding the fundamentals of plastic deformation mechanisms in polycrystalline thin metal films and the associated size effects is crucial to the design and fabrication of microelectronic devices. A combination of in-situ synchrotron diffraction experiments was conducted to investigate two cooperative plastic deformation mechanisms in polycrystalline face-centered cubic thin metal films: conjugate deformation twinning in uniaxially strained polycrystalline thin gold films and subgrain structure rotations in biaxially strained polycrystalline thin silver films. The experimental results demonstrate an increase in the total coverage of (115) oriented deformation twins in the thin gold films upon uniaxial deformation to 2% strain at a macroscopic yield stress of 250 MP

Revealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD

ISSN:1047-4838ISSN:0148-6608ISSN:1543-185