11 research outputs found
ZnO thin films by MOCVD
Zinc oxide has unique properties that make it attractive for a variety of electronic and electro optical applications. Recent technological advances for zinc oxide thin film deposition, along with the availability of production-worthy deposition tools, should create new opportunities for zinc oxide based devices
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SiC Power MOSFET with Improved Gate Dielectric
In this STTR program, Structured Materials Industries (SMI), and Cornell University are developing novel gate oxide technology, as a critical enabler for silicon carbide (SiC) devices. SiC is a wide bandgap semiconductor material, with many unique properties. SiC devices are ideally suited for high-power, highvoltage, high-frequency, high-temperature and radiation resistant applications. The DOE has expressed interest in developing SiC devices for use in extreme environments, in high energy physics applications and in power generation. The development of transistors based on the Metal Oxide Semiconductor Field Effect Transistor (MOSFET) structure will be critical to these applications
Challenges and Opportunities for Multi-functional Oxide Thin Films for Voltage Tunable Radio Frequency/Microwave Components
There has been significant progress on the fundamental science and technological applications of complex oxides and multiferroics. Among complex oxide thin films, barium strontium titanate (BST) has become the material of choice for room-temperature-based voltage-tunable dielectric thin films, due to its large dielectric tunability and low microwave loss at room temperature. BST thin film varactor technology based reconfigurable radio frequency (RF)/microwave components have been demonstrated with the potential to lower the size, weight, and power needs of a future generation of communication and radar systems. Low-power multiferroic devices have also been recently demonstrated. Strong magneto-electric coupling has also been demonstrated in different multiferroic heterostructures, which show giant voltage control of the ferromagnetic resonance frequency of more than two octaves. This manuscript reviews recent advances in the processing, and application development for the complex oxides and multiferroics, with the focus on voltage tunable RF/microwave components. The over-arching goal of this review is to provide a synopsis of the current state-of the-art of complex oxide and multiferroic thin film materials and devices, identify technical issues and technical challenges that need to be overcome for successful insertion of the technology for both military and commercial applications, and provide mitigation strategies to address these technical challenges
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Low Cost Production of InGaN for Next-Generation Photovoltaic Devices
The goal of this project is to develop a low-cost and low-energy technology for production of photovoltaic devices based on InGaN materials. This project builds on the ongoing development by Structured Materials Industries (SMI), of novel thin film deposition technology for Group III-Nitride materials, which is capable of depositing Group-III nitride materials at significantly lower costs and significantly lower energy usage compared to conventional deposition techniques. During this project, SMI demonstrated deposition of GaN and InGaN films using metalorganic sources, and demonstrated compatibility of the process with standard substrate materials and hardware components
Low Cost Production of InGaN for Next-Generation Photovoltaic Devices
The goal of this project is to develop a low-cost and low-energy technology for production of photovoltaic devices based on InGaN materials. This project builds on the ongoing development by Structured Materials Industries (SMI), of novel thin film deposition technology for Group III-Nitride materials, which is capable of depositing Group-III nitride materials at significantly lower costs and significantly lower energy usage compared to conventional deposition techniques. During this project, SMI demonstrated deposition of GaN and InGaN films using metalorganic sources, and demonstrated compatibility of the process with standard substrate materials and hardware components
SiC Power MOSFET with Improved Gate Dielectric
In this STTR program, Structured Materials Industries (SMI), and Cornell University are developing novel gate oxide technology, as a critical enabler for silicon carbide (SiC) devices. SiC is a wide bandgap semiconductor material, with many unique properties. SiC devices are ideally suited for high-power, highvoltage, high-frequency, high-temperature and radiation resistant applications. The DOE has expressed interest in developing SiC devices for use in extreme environments, in high energy physics applications and in power generation. The development of transistors based on the Metal Oxide Semiconductor Field Effect Transistor (MOSFET) structure will be critical to these applications
Growth and characterization of α-, β-, and ϵ-phases of Ga2O3 using MOCVD and HVPE techniques
Heteroepitaxial films of Ga O were grown on c-plane sapphire (0001). The stable phase β-Ga O was grown using the metalorganic chemical vapor deposition technique, regardless of precursor flow rates, at temperatures between 500 C and 850 C. Metastable α- and ϵ-phases were grown when using the halide vapor phase epitaxy (HVPE) technique, at growth temperatures between 650 C and 850 C, both separately and in combination. XTEM revealed the better lattice-matched α-phase growing semi-coherently on the substrate, followed by ϵ-Ga O . The epitaxial relationship was determined to be [ ] ϵ-Ga O [ ] α-Ga O [ ] α-Al O . SIMS revealed that epilayers forming the ϵ-phase contain higher concentrations of Cl introduced during HVPE growth
Vapor-Transport Synthesis and Annealing Study of Zn<sub><i>x</i></sub>Mg<sub>1–<i>x</i></sub>O Nanowire Arrays for Selective, Solar-Blind UV‑C Detection
This
work uniquely reports the synthesis of Zn<sub><i>x</i></sub>Mg<sub>1–<i>x</i></sub>O nanowires and submicron
columns by utilizing a traditional carbothermal reduction process
toward forming ZnO nanowire ultraviolet detectors, while simultaneously
utilizing Mg<sub>3</sub>N<sub>2</sub> as the source of Mg. To investigate
the relationship between Mg content in the ZnO lattice and the cutoff
wavelength for high spectral responsivity, the nanowires were annealed
in a series of designed conditions, whereas chemical, nanostructural,
and optoelectronic characteristics were compared before and after
treatment. Postanneal scanning electron micrographs revealed a reduction
of the average ensemble nanowire dimensions, which was correlated
to the modification of ZnO lattice parameters stemming from Zn<sup>2+</sup> dissociation and Mg<sup>2+</sup> substitution (confirmed
via Raman spectroscopy). The analysis of cathodoluminescence spectra
revealed a blueshift of the peak alloy band-edge emission along with
a redshift of the ZnO band-edge emission; and both were found to be
strong functions of the annealing temperature. The conversion of Zn<sub>2</sub>SiO<sub>4</sub> to Mg<sub>2</sub>SiO<sub>4</sub> (in O<sub>2</sub>) and MgSiO<sub>3</sub> (in Ar) was found to correspond to
transformations (shifting and scaling) of high-energy luminescence
peaks and was confirmed with X-ray diffraction analysis. The tunability
of the cutoff photodetection wavelength was evaluated as the nanowire
arrays exhibited selective absorption by retaining elevated conduction
under high-energy UV-C irradiation after thermal treatment but exhibiting
suppressed conductivity and a single order of magnitude reduction
in both spectral responsivity (<i>R</i><sub>λ</sub>) and photoconductive gain (<i>G</i>) under UV-A illumination.
Noise analysis revealed that the variation of detectivity (<i>D</i>*) depended on the regime of ultraviolet irradiation, and
that these variations are related to thermal noise resulting from
oxygen-related defects on both nanowire and substrate surfaces. These
results suggest a minor design tradeoff between the noise characteristics
of thermally treated ZnMgO nanowire array UV detectors and the tunability
of their spectral sensitivity
Challenges and opportunities for multi-functional oxide thin films for voltage tunable radio frequency/microwave components
<p>There has been significant progress on the fundamental science and technological applications of complex oxides and multiferroics. Among complex oxide thin films, barium strontium titanate (BST) has become the material of choice for room-temperature-based voltage-tunable dielectric thin films, due to its large dielectric tunability and low microwave loss at room temperature. BSTthin film varactor technology based reconfigurable radio frequency (RF)/microwave components have been demonstrated with the potential to lower the size, weight, and power needs of a future generation of communication and radar systems. Low-power multiferroic devices have also been recently demonstrated. Strong magneto-electric coupling has also been demonstrated in different multiferroic heterostructures, which show giant voltage control of the ferromagnetic resonance frequency of more than two octaves. This manuscript reviews recent advances in the processing, and application development for the complex oxides andmultiferroics, with the focus on voltage tunable RF/microwave components. The over-arching goal of this review is to provide a synopsis of the current state-of the-art of complex oxide andmultiferroic thin film materials and devices, identify technical issues and technical challenges that need to be overcome for successful insertion of the technology for both military and commercial applications, and provide mitigation strategies to address these technical challenges.</p