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2 research outputs found
High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate
Author
Aleksandra Wierzbicka
Alexander Belyaev
+7 more
Andrian V Kuchuk
Hryhorii Stanchu
Kamil Klosek
Marta Sobanska
Nadiia Safriuk
Vasyl Kladko
Zbigniew R Zytkiewicz
Publication venue
Springer Nature
Publication date
01/01/2015
Field of study
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Springer - Publisher Connector
High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate
Author
A Haab
A Kuchuk
+22 more
A Wierzbicka
Aleksandra Wierzbicka
Alexander Belyaev
Andrian V Kuchuk
B Jenichen
Hryhorii Stanchu
J Borysiuk
Kamil Klosek
M Hugues
Marta Sobanska
N Thillosen
Nadiia Safriuk
S Fernández-Garrido
T Metzger
V Consonni
V Kaganer
V Kladko
Vasyl Kladko
W Shumin
W Tseng
X Zhang
Zbigniew R Zytkiewicz
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
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