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research
High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate
Authors
Aleksandra Wierzbicka
Alexander Belyaev
+7 more
Andrian V Kuchuk
Hryhorii Stanchu
Kamil Klosek
Marta Sobanska
Nadiia Safriuk
Vasyl Kladko
Zbigniew R Zytkiewicz
Publication date
1 January 2015
Publisher
Springer Nature
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Abstract
Abstract is not available.
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Last time updated on 05/06/2019
Springer - Publisher Connector
See this paper in CORE
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Last time updated on 30/04/2017
