New materials of RMn2Ge2 type for thermomagnetic devices

The new type of the working media for thermomagnetic devices is proposed: the intermetallic compounds which have large magnetocrystalline anisotropy and exhibit the spontaneous phase transition from the antiferromagnetic (AF) to ferromagnetic (F) state when the temperature increases above the critical value T$\text{}_{t}$. Moreover, the anisotropy in AF state in the fields below the critical AF-F transition field must be much lower than in the F state. In the present paper the Gd$\text{}_{0.6}$Sm$\text{}_{0.4}$Mn$\text{}_{2}$Ge$\text{}_{2}$ compound belonging to the tetragonal RMn$\text{}_{2}$Ge$\text{}_{2}$ system is investigated. This compound has the critical temperature T$\text{}_{t}$ = 280 K. The thermomagnetic cycle can be realized on the AF-F-AF transition near T$\text{}_{t2}$. The interval of the working temperatures can be shifted with the change of the Gd and Sm concentration

New Materials of RMn2\text{}_{2}Ge2\text{}_{2} Type for Thermomagnetic Devices

The new type of the working media for thermomagnetic devices is proposed: the intermetallic compounds which have large magnetocrystalline anisotropy and exhibit the spontaneous phase transition from the antiferromagnetic (AF) to ferromagnetic (F) state when the temperature increases above the critical value T$\text{}_{t}$. Moreover, the anisotropy in AF state in the fields below the critical AF-F transition field must be much lower than in the F state. In the present paper the Gd$\text{}_{0.6}$Sm$\text{}_{0.4}$Mn$\text{}_{2}$Ge$\text{}_{2}$ compound belonging to the tetragonal RMn$\text{}_{2}$Ge$\text{}_{2}$ system is investigated. This compound has the critical temperature T$\text{}_{t}$ = 280 K. The thermomagnetic cycle can be realized on the AF-F-AF transition near T$\text{}_{t2}$. The interval of the working temperatures can be shifted with the change of the Gd and Sm concentration

Novel Organosilicon Betaines

The structure of organosilicon betaines R3P+CMe2SiMe2S− (R = Ph and Me2N) was determined by X-ray diffraction analysis