The friction behavior of semiconductors Si and GaAs in contact with pure metals

The friction behavior of the semiconductors silicon and gallium arsenide in contact with pure metals was studied. Five transition and two nontransition metals, titanium, tantalum, nickel, palladium, platinum, copper, and silver, slid on a single crystal silicon (111) surface. Four metals, indium, nickel, copper and silver, slid on a single crystal gallium arsenide (100) surface. Experiments were conducted in room air and in a vacuum of 10 to the minus 7th power N/sq cm (10 to the minus 9th power torr). The results indicate that the sliding of silicon on the transition metals exhibits relatively higher friction than for the nontransition metals in contact with silicon. There is a clear correlation between friction and Schottky barrier height formed at the metal silicon interface for the transition metals. Transition metals with a higher barrier height on silicon had a lower friction. The same effect of barrier height was found for the friction of gallium arsenide in contact with metals

Friction behavior of silicon in contact with titanium, nickel, silver and copper

Sliding friction experiments are conducted with the semiconductor silicon in contact with the metals titanium, nickel, copper, and silver. Sliding is on the (111) plane of single-crystal silicon in the 112 crystallographic direction both in dry and lubricated (mineral oil) sliding. The friction coefficient in dry sliding is controlled by adhesion and the surface chemical activity of the metal. The more active the metal the stronger the adhesion and the higher the friction. In lubricated sliding the lubricant absorbs to the surfaces and reduces the importance of metal chemical effects. In lubricated sliding, silicon ceases to behave in a brittle manner and undergoes plastic deformation under load

Effect of barrier height on friction behavior of the semiconductors silicon and gallium arsenide in contact with pure metals

Friction experiments were conducted for the semiconductors silicon and gallium arsenide in contact with pure metals. Polycrystalline titanium, tantalum, nickel, palladium, and platinum were made to contact a single crystal silicon (111) surface. Indium, nickel, copper, and silver were made to contact a single crystal gallium arsenide (100) surface. Sliding was conducted both in room air and in a vacuum of 10 to the minus 9th power torr. The friction of semiconductors in contact with metals depended on a Schottky barrier height formed at the metal semiconductor interface. Metals with a higher barrier height on semiconductors gave lower friction. The effect of the barrier height on friction behavior for argon sputtered cleaned surfaces in vacuum was more specific than that for the surfaces containing films in room air. With a silicon surface sliding on titanium, many silicon particles back transferred. In contrast, a large quantity of indium transferred to the gallium arsenide surface

Length-weight relationship of five serranids from Palawan Island, Philippines

The parameters a and b of the length-weight relationship (LWR) of the form W=aLb are presented for five species of serranids belonging to the genus Cephalopolis. The fish samples used for the study were caught by hook and line, fish corrals, and spearguns during August 1995 to December 1998 from the waters around Palawan Island, Philippines. Information on the LWR of six fishes from other studies conducted in Palawan is also provided

Monochromatic Medical Radiography by Particle Bombardment II

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