4 research outputs found

    Influence of neutron irradiation on elctrooptical and structural properties of silicon

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    Processes of structure defects formation, which accompanied by oxygen precipitation after a neutron irradiation (10¹⁵- 10¹⁹ n/cm²) and high-temperature treatment (800 - 1000°С) in CZ silicon, were investigated by the transmission electron microscopy. Influence of the structure defects on electrooptical properties of silicon was revealed

    Modern Trends of Organic Chemistry in Russian Universities

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