Irreversibility line and low-field grain-boundary pinning in electron-doped superconducting thin films

AC magnetic susceptibilities of electron-doped Pr_{1.85}Ce_{0.15}CuO_4 (PCCO) and Sm_{1.85}Ce_{0.15}CuO_4 (SCCO) granular thin films have been measured as a function of temperature and magnetic-field strength. Depending on the level of homogeneity of our films, two different types of the irreversibility line (IL) defined as the intergrain-loss peak temperature in the imaginary part of susceptibility have been found. The obtained results are described via the critical-state model taking into account the low-field grain-boundary pinning. The extracted pinning-force densities in more granular SCCO films turn out to be four times larger than their counterparts in less granular PCCO films

Resultados dos ensaios sul brasileiros de trigo do Rio Grande do Sul, em 1985.

bitstream/item/119646/1/FOL-02362.pdfTrabalho apresentado na XVIII Reunião da Comissão Sul Brasileira de Pesquisa de Trigo, Chapecó, 1986

Sampling system for wheat (Triticum aestivum L) area estimation using digital LANDSAT MSS data and aerial photographs

A procedure to estimate wheat (Triticum aestivum L) area using sampling technique based on aerial photographs and digital LANDSAT MSS data is developed. Aerial photographs covering 720 square km are visually analyzed. To estimate wheat area, a regression approach is applied using different sample sizes and various sampling units. As the size of sampling unit decreased, the percentage of sampled area required to obtain similar estimation performance also decreased. The lowest percentage of the area sampled for wheat estimation with relatively high precision and accuracy through regression estimation is 13.90% using 10 square km as the sampling unit. Wheat area estimation using only aerial photographs is less precise and accurate than those obtained by regression estimation

Possible manifestation of spin fluctuations in the temperature behavior of resistivity in Sm_{1.85}Ce_{0.15}CuO_4 thin films

A pronounced step-like (kink) behavior in the temperature dependence of resistivity $\rho (T)$ is observed in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films around $T_{sf}=87K$ and attributed to manifestation of strong spin fluctuations induced by $Sm^{3+}$ moments with the energy $\hbar \omega_{sf}=k_BT_{sf}\simeq 7meV$. In addition to fluctuation induced contribution $\rho_{sf}(T)$ due to thermal broadening effects (of the width $\omega_{sf}$), the experimental data are found to be well fitted accounting for residual (zero-temperature) $\rho_{res}$, electron-phonon $\rho _{e-ph}(T)=AT$ and electron-electron $\rho_{e-e}(T)=BT^2$ contributions. The best fits produced $\omega_p=2.1meV$, $\tau_0^{-1}=9.5\times 10^{-14}s^{-1}$, $\lambda =1.2$, and $E_F=0.2eV$ for estimates of the plasmon frequency, the impurity scattering rate, electron-phonon coupling constant, and the Fermi energy, respectively.Comment: 6 pages (REVTEX4), 2 EPS figures; accepted for publication in JETP Letter