An electrochemical, microtopographical and ambient pressure x-ray photoelectron spectroscopic investigation of Si/TiO2/Ni/electrolyte interfaces

The electrical and spectroscopic properties of the TiO2/Ni protection layer system, which enables stabilization of otherwise corroding photoanodes, have been investigated in contact with electrolyte solutions by scanning-probe microscopy, electrochemistry and in-situ ambient pressure X-ray photoelectron spectroscopy (AP-XPS). Specifically, the energy-band relations of the p+-Si/ALD-TiO2/Ni interface have been determined for a selected range of Ni thicknesses. AP-XPS measurements using tender X-rays were performed in a three-electrode electrochemical arrangement under potentiostatic controlto obtain information from the semiconductor near-surface region, the electrochemical double layer (ECDL) and the electrolyte beyond the ECDL. The degree of conductivity depended on the chemical state of the Ni on the TiO2 surface. At low loadings of Ni, the Ni was present primarily as an oxide layer and the samples were not conductive, although the TiO2 XPS core levels nonetheless displayed behavior indicative of a metal-electrolyte junction. In contrast, as the Ni thickness increased, the Ni phase was primarily metallic and the electrochemical behavior became highly conductive, with the AP-XPS data indicative of a metal-electrolyte junction. Electrochemical and microtopographical methods have been employed to better define the nature of the TiO2/Ni electrodes and to contextualize the AP-XPS results

Protection of inorganic semiconductors for sustained, efficient photoelectrochemical water oxidation

Small-band-gap (Eg < 2 eV) semiconductors must be stabilized for use in integrated devices that convert solar energy into the bonding energy of a reduced fuel, specifically H2(g) or a reduced-carbon species such as CH3OH or CH4. To sustainably and scalably complete the fuel cycle, electrons must be liberated through the oxidation of water to O2(g). Strongly acidic or strongly alkaline electrolytes are needed to enable efficient and intrinsically safe operation of a full solar-driven water-splitting system. However, under water-oxidation conditions, the small-band-gap semiconductors required for efficient cell operation are unstable, either dissolving or forming insulating surface oxides. We describe herein recent progress in the protection of semiconductor photoanodes under such operational conditions. We specifically describe the properties of two protective overlayers, TiO2/Ni and NiOx, both of which have demonstrated the ability to protect otherwise unstable semiconductors for >100 h of continuous solar-driven water oxidation when in contact with a highly alkaline aqueous electrolyte (1.0 M KOH(aq)). The stabilization of various semiconductor photoanodes is reviewed in the context of the electronic characteristics and a mechanistic analysis of the TiO2 films, along with a discussion of the optical, catalytic, and electronic nature of NiOx films for stabilization of semiconductor photoanodes for water oxidation

Protection of inorganic semiconductors for sustained, efficient photoelectrochemical water oxidation

Small-band-gap (Eg < 2 eV) semiconductors must be stabilized for use in integrated devices that convert solar energy into the bonding energy of a reduced fuel, specifically H2(g) or a reduced-carbon species such as CH3OH or CH4. To sustainably and scalably complete the fuel cycle, electrons must be liberated through the oxidation of water to O2(g). Strongly acidic or strongly alkaline electrolytes are needed to enable efficient and intrinsically safe operation of a full solar-driven water-splitting system. However, under water-oxidation conditions, the small-band-gap semiconductors required for efficient cell operation are unstable, either dissolving or forming insulating surface oxides. We describe herein recent progress in the protection of semiconductor photoanodes under such operational conditions. We specifically describe the properties of two protective overlayers, TiO2/Ni and NiOx, both of which have demonstrated the ability to protect otherwise unstable semiconductors for >100 h of continuous solar-driven water oxidation when in contact with a highly alkaline aqueous electrolyte (1.0 M KOH(aq)). The stabilization of various semiconductor photoanodes is reviewed in the context of the electronic characteristics and a mechanistic analysis of the TiO2 films, along with a discussion of the optical, catalytic, and electronic nature of NiOx films for stabilization of semiconductor photoanodes for water oxidation

Operando Analyses of Solar Fuels Light Absorbers and Catalysts

Operando synchrotron radiation photoelectron spectroscopy in the tender X-ray energy range has been used to obtain information on the energy-band relations of semiconductor and metal-covered semiconductor surfaces while in direct contact with aqueous electrolytes under potentiostatic control. The system that was investigated consists of highly doped Si substrates that were conformally coated with ∼70 nm titania films produced by atomic-layer deposition. TiO2/electrolyte and Si/TiO2/Ni/electrolyte interfaces were then analyzed by synchrotron radiation photoelectron spectroscopy. The PES data allows for determination of the flat-band position and identification of potential regions in which Fermi level pinning, depletion, or accumulation occurred. Operando X-ray absorption spectroscopy (XAS) techniques were additionally used to investigate the properties of heterogeneous electrocatalysts for the oxygen-evolution reaction. Operando XAS including the pre-edge, edge and EXAFS regions allowed the development of a detailed picture of the catalysts under operating conditions, and elucidated the changes in the physical and electronic structure of the catalyst that accompanied increases in the applied potential. Specifically, XAS data, combined with DFT studies, indicated that the activity of the electrocatalyst correlated with the formation of Fe dopant sites in γ-NiOOH

Operando Analyses of Solar Fuels Light Absorbers and Catalysts

Operando synchrotron radiation photoelectron spectroscopy in the tender X-ray energy range has been used to obtain information on the energy-band relations of semiconductor and metal-covered semiconductor surfaces while in direct contact with aqueous electrolytes under potentiostatic control. The system that was investigated consists of highly doped Si substrates that were conformally coated with ∼70 nm titania films produced by atomic-layer deposition. TiO2/electrolyte and Si/TiO2/Ni/electrolyte interfaces were then analyzed by synchrotron radiation photoelectron spectroscopy. The PES data allows for determination of the flat-band position and identification of potential regions in which Fermi level pinning, depletion, or accumulation occurred. Operando X-ray absorption spectroscopy (XAS) techniques were additionally used to investigate the properties of heterogeneous electrocatalysts for the oxygen-evolution reaction. Operando XAS including the pre-edge, edge and EXAFS regions allowed the development of a detailed picture of the catalysts under operating conditions, and elucidated the changes in the physical and electronic structure of the catalyst that accompanied increases in the applied potential. Specifically, XAS data, combined with DFT studies, indicated that the activity of the electrocatalyst correlated with the formation of Fe dopant sites in γ-NiOOH

Unravelling the electrochemical double layer by direct probing of the solid/liquid interface

The electrochemical double layer plays a critical role in electrochemical processes. Whilst there have been many theoretical models predicting structural and electrical organization of the electrochemical double layer, the experimental verification of these models has been challenging due to the limitations of available experimental techniques. The induced potential drop in the electrolyte has never been directly observed and verified experimentally, to the best of our knowledge. In this study, we report the direct probing of the potential drop as well as the potential of zero charge by means of ambient pressure X-ray photoelectron spectroscopy performed under polarization conditions. By analyzing the spectra of the solvent (water) and a spectator neutral molecule with numerical simulations of the electric field, we discern the shape of the electrochemical double layer profile. In addition, we determine how the electrochemical double layer changes as a function of both the electrolyte concentration and applied potential

Stabilizing the Meniscus for Operando Characterization of Platinum During the Electrolyte Consuming Alkaline Oxygen Evolution Reaction

Achieving a molecular-level understanding of interfacial (photo)electrochemical processes is essential in order to tailor novel and highly-performing catalytic systems. The corresponding recent development of in situ and operando tools has posed new challenges on experimental architectures. In this study, we use ambient pressure X-ray photoelectron spectroscopy (AP-XPS) to probe the solid/liquid electrified interface of a polycrystalline Pt sample in contact with an alkaline electrolyte during hydrogen and oxygen evolution reactions. Using the “dip-and-pull” technique to probe the interface through a thin liquid layer generated on the sample surface, we observe that the electrolyte meniscus becomes unstable under sustained driving of an electrolyte-consuming reaction (such as water oxidation). The addition of an electrochemically inert supporting electrolyte mitigates this issue, maintaining a stable meniscus layer for prolonged reaction times. In contrast, for processes in which the electrolyte is replenished in the reaction pathway (i.e. water reduction in alkaline conditions), we find that the solid/liquid interface remains stable without addition of a secondary supporting electrolyte. The approach described in this work allows the extension of operando AP-XPS capabilities using the “dip-and-pull” method to a broader class of reactions consuming ionic species during complex interfacial faradaic processes