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6 research outputs found
Effects of Protecting Group of Fluoroalcohol on Lithographic Performance.
Author
ANDO S
BAE Y C
+9 more
DAMMEL R R
H. Ito G.M. Wallraff, N. Fender, P
I. Sharif D. DesMarteau, L. Ford,
ITO H
M.K. Crawford A.E. Feiring, J. Fel
SHIRAI M
T. Itani M. Toriumi, T. Naito, S.
W. Li P.R. Varanasai, M.C. Lawson,
Y. Kawaguchi J. Irisawa, S. Kodama
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref
Characterization of Fluoropolymer Resist for 157-nm Lithography
Author
D. Schmaljohann Y.C. Bae, G.L. Wei
H. Ito G.M. Wallraff, P. Brock, N.
+6 more
M. Toriumi S. Ishikawa, S. Miyoshi
M.K. Crawford A.E. Feiring, J. Fel
N. Shida H. Watanabe, T. Yamazaki,
R.J. Hung H.V. Tran, B.C. Trinque,
S. Kodama I. Kaneko, Y. Takebe, S.
T.H. Fedynyshyn R.R. Kunz, R.F. Si
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref
A Study of an Organic Bottom Antireflective Coating for 157-nm Lithography
Author
D. Schmaljohann Y.C. Bae, G.L. Wei
H. Ito G.M. Wallraff, P. Brock, N.
+7 more
J. Claypool R. Puligadda, J. Akers
M. Toriumi S. Ishikawa, S. Miyoshi
M.K. Crawford A.E. Feiring, J. Fel
N. Shida H. Watanabe, T. Yamazaki,
R.J. Hung H.V. Tran, B.C. Trinque,
S. Kodama I. Kaneko, Y. Takebe, S.
T.H. Fedynyshyn R.R. Kunz, R.F. Si
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref
Strategies for High Transparency Acrylate Resists for 157 nm Lithography
Author
BAE Y C
BAE Y C
+11 more
D. Schmaljohann Y.C. Bae, G.L. Wei
K.E. Gonsalves J. Wang, and H. Wu
K.E. Gonsalves J. Wang, and H. Wu
KWARK Y-J
L.S. Boguslavskaya I.Y. Panteleeva
M.K. Crawford A.E. Feiring, J. Fel
OBER C K
R.R. Kunz T.M. Bloomstein, D.E. Ha
S.N. Osipov A. Golubev, N. Sewald,
SCHMALJOHANN D
V. Vohra K. Douki, X.-Q. Liu, Y.-J
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref
Tetrafluoroethylene-based Fluoropolymers for 157-nm Resist Materials
Author
B.C. Trinque B.P. Osborn, C.R. Cha
BAE Y C
+28 more
CHIBA T
CRAWFORD M K
DAMMEL R R
FEDYNYSHYN T H
G. Taylor C.B. Xu, G. Teng, J. Leo
H. Ito Hoa D. Truong, M. Okazaki,
ITO H
KUNZ R R
M. Koh T. Ishikawa, T. Araki, H. A
M. Toriumi I. Satoh, and T. Itani
M. Toriumi N. Shida, H. Watanabe,
M. Toriumi S. Ishikawa, S. Miyoshi
M. Toriumi T. Itani, J. Yamashita,
M.K. Crawford A.E. Feiring, J. Fel
M.K. Crawford A.E. Feiring, J. Fel
N. Matsuzawa S. Mori, E. Yano, S.
N. Shida H. Watanabe, T. Yamazaki,
OBER C K
R.R. Dammel R. Sakamuri, S.-H. Lee
ROTHSCHILD M
S. Kodama I. Kaneko, Y. Takebe, S.
SCHMALJOHANN D
T.H. Fedynyshyn R.R. Kunz, R.F. Si
T.M. Bloomstein M. Rothschild, R.R
TORIUMI M
TRAN H V
V.R. Vohra K. Douki, Y.-J. Kwark,
Y. Uetani K. Hashimoto, Y. Miya, I
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref
DFT Calculations of Photoabsorption Spectra for Alicyclic and Heterocyclic Compounds in the VUV Region
Author
A. Bondi
ANDO S
+18 more
B.C. Trinque B.P. Osborn, C.R. Cha
CHIBA T
FUJIGAYA T
G. Slonimskii A. Askadskii, and A.
H. Ito G.M. Wallraff, P. Brock, N.
H. Nakatsuji
ITO H
M.E. Casida C. Jamorski, K.C. Casi
M.K. Crawford A.E. Feiring, J. Fel
N. Fender P.J. Brock, W. Chau, S.
N. Fender P.J. Brock, W. Chau, S.
R.R. Kunz T.M. Bloomstein D.E. Har
S. Kodama I Kaneko, Y. Kobe, S. Ok
T. Ushirogouchi K. Asakawa, N. Shi
T. Yamazaki and T. Itani
T.M. Bloomstein M.W. Horn, M. Roth
TRAN H V
WILLSON C G
Publication venue
'Technical Association of Photopolymers, Japan'
Publication date
01/01/2003
Field of study
No full text
Crossref