31 research outputs found
Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements
Full text linkKalibrierung einer Heiz/Kühlkammer für Röntgenbeugungsmessungen; Kornwechselwirkung in dünnen Schichten
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Tailoring the stress-depth profile in thin films; the case of γ’-Fe<sub>4</sub>N<sub>1-x</sub>
No full textMechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths
No full textLarge excess volume in grain boundaries of stressed, nanocrystalline metallic thin films: its effect on grain-growth kinetics
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In-situ X-ray diffraction investigations of thin films: determination of thermoelastic constants.
No full textApplication of a single-reflection collimating multilayer optic for x-ray diffraction experiments employing parallel-beam geometry
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