10 research outputs found

    30 Jahre Europawahlen

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    Akzeptanz autonomer Produktionsplanungs- und -steuerungssysteme: Unternehmensbefragung zur Verbreitung und Akzeptanz autonomer Steuerungssysteme

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    Producing individualized products leads to enormous planning complexity. As todayâs methods of production planning and control are not able to cope with these challenges anymore, researchers are working on entirely autonomous control systems. An extensive survey interviewing producing companies was conducted to investigate the usage of production planning and control systems as well as the acceptance of autonomous control systems. The results of this survey, which are described in the following contribution, are used to optimize the design and implementation of autonomous production planning and control systems

    Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

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    In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional solar cells. Quantitative surface potential measurements are crucial for understanding the operation principles of functional nanostructures in these electronic devices. Nevertheless, KPFM is prone to certain imaging artifacts, such as crosstalk from topography or stray electric fields. Here, we compare different amplitude modulation (AM) and frequency modulation (FM) KPFM methods on a reference structure consisting of an interdigitated electrode array. This structure mimics the sample geometry in device measurements, e.g., on thin film transistors or on solar cell cross sections. In particular, we investigate how quantitative different KPFM methods can measure a predefined externally applied voltage difference between the electrodes. We found that generally, FM-KPFM methods provide more quantitative results that are less affected by the presence of stray electric fields compared to AM-KPFM methods
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