From Theory to Action: Good Enough Digital Preservation for Under-Resourced Cultural Heritage Institutions

Libraries, archives, museums, and other cultural heritage organizations collect, create, and steward a rapidly increasing volume of digital content. Both research conclusions and professionals’ real-life experiences expose the inherent fragility of this content. The cultural heritage and information science communities have developed guidelines, best practices, policies, procedures, and processes that can enable an organization to achieve high levels of digital preservation. However, these protocols are often complex, leaving many practitioners attempting to address the challenge of preserving digital materials feeling overwhelmed. This is particularly true for professionals serving smaller institutions that are often operating with restricted resources like small staff sizes, a lack of specialized expertise, dated technical infrastructures, and/or limited budgets. This white paper is the result of a three year investigation, funded by the Institute of Museum and Library Services, of affordable, scalable digital preservation solutions that can be successfully implemented at under-resourced organizations. It reports the results of large-scale testing of several digital preservation tools and services, suggests pragmatic digital preservation options, including an incremental approach to digital preservation practices, and asserts that communities of practice are key to success.Institute of Museum and Library Service

Structured Layer of Rhenium Dye on SiO₂ and TiO₂ Surfaces by Langmuir–Blodgett Technique

We demonstrate the Langmuir–Blodgett assembly of two rhenium–bipyridine complexes containing a flexible or an aromatic bridge, and transfer of the monolayer to SiO₂ and single crystal TiO₂ substrates. Both of the complexes (ReEC and Re2TC) have a hydrophilic carboxylic acid group, which preferentially anchors into the water subphase, and forms stable monolayers at surface pressures up to 40 mN/m. The optimum conditions for the formation of complete monolayers of both ReEC and Re2TC were identified through characterization of the morphology by atomic force microscopy (AFM), the thickness by ellipsometry, and the surface coverage by X-ray photoelectron spectroscopy (XPS). X-ray reflectivity measurements (XRR) are consistent with the orientation of the molecules normal to the substrate, and their extension to close to their calculated maximum length. Parameters derived from XRR analysis show that there is a higher packing density for Re2TC monolayers than for ReEC monolayers, attributable to the more rigid bridge in the Re2TC molecule