Money Urbanism : progetto urbano e cicli di produzione della citt\ue0

Money Urbanism d\ue0 il titolo ad un\u2019esperienza didattica sul rapporto fra \u201cprogetto urbano e denaro\u201d all\u2019Universita\u300 Iuav di Venezia e, parallelamente, ha dato avvio ad una ricerca nel campo del progetto e degli strumenti di governo delle trasformazioni urbane che sperimentano l\u2019uso temporaneo, come strumento anti-ciclico rispetto all\u2019esaurirsi di cicli economici e conseguenti fenomeni di abbandono e dismissione di componenti urbane. A questo duplice percorso soggiace, pertanto, l\u2019idea, supportata pero\u300 da molti accadimenti di cronaca e da una ampia bibliografia disciplinare internazionale e nazionale, che il rapporto fra uso di risorse finanziarie e progetto di citta\u300 debba essere in qualche modo criticato, non per negarne l\u2019esistenza o l\u2019utilita\u300 e neppure per dichiararne una definitiva demonizzazione, ma per una necessaria evoluzione - se non proprio rivoluzione - che ridefinisca il ruolo non esclusivamente ancillare e che invece potrebbe dirsi ancora \u201cpolitico\u201d del progettare

nondestructive wood discrimination ftir fourier transform infrared spectroscopy in the characterization of different wood species used for artistic objects

Wooden artifacts represent a significant component of past cultures. Successful conservation of wooden artifacts depends on the knowledge of wood structure and types. It is critical that conservators know the category of wood that they are treating in order to successfully conserve it. Recently, vibrational spectroscopy has been successfully applied to determine the chemical structure of wood and to characterize wood types. FTIR (Fourier Transform Infrared) is a useful nondestructive or micro-destructive analytical technique providing information about chemical bonding and molecular structure. Its application in the discrimination between softwoods (conifers) and hardwoods (broad-leafs) has already been reported. The aim of the present study was to investigate the potential of FTIR as a tool for the discrimination between different wood types belonging to the same genus. Three different hardwood species, namely poplar (Populus spp), lime (Tilia spp) and birch (Betula spp), were investigated by means of FTIR spectroscopy. The woods were first inspected using a light microscope to certify the wood essence types through micrographic and morphoanatomical features. The FTIR spectra in the 4000 cm[Formula: see text] to 450 cm[Formula: see text] region were recorded using a Perkin-Elmer Spectrum 100 spectrometer. To enhance the qualitative interpretation of the IR spectra, second derivatives of all spectra were calculated using the Spectrum software to separate superimposed bands and to extract fine spectral details. To obtain a comprehensive characterization, the essences under investigation were also analyzed by means of Raman Spectroscopy. Clear differences were found in the spectra of the three samples confirming FTIR to be a powerful tool for wood type discrimination

ANEM: A rotating composite target to produce an atmospheric-like neutron beam at the LNL SPES facility

A fast neutron (E> MeV) irradiation facility is under development at the 70 MeV SPES proton cyclotron at LNL (Legnaro, Italy) to investigate neutron-induced Single Event Effects (SEE) in microelectronic devices and systems. After an overview on neutron-induced SEE in electronics, we report on the progress in the design of ANEM (Atmospheric Neutron EMulator), a water-cooled rotating target made of Be and W to produce neutrons with an energy spectrum similar to that of neutrons produced by cosmic rays at sea-level. In ANEM, the protons from the cyclotron alternatively impinge on two circular sectors of Be and W of different areas; the effective neutron spectrum is a weighted combination of the spectra from the two sectors. In this contribution, we present the results of thermal-mechanical Finite Element Analysis (ANSYS) calculations of the performance of the ANEM prototype. The calculations at this stage indicate that ANEM can deliver fast neutrons with an atmospheric-like energy spectrum and with an integral flux [Formula: see text](1-70 MeV) [Formula: see text]107 n cm[Formula: see text]s[Formula: see text] that is 3×109 more intense than the natural one at sea-level: a very competitive flux for SEE testing

Heavy-ion test report of LTC1668 DAC - LiteBIRD-NOTE-84

This document presents the results of a heavy-ion test program carried out on the Linear Technology LT1668 16-bit 50 Msps DAC (LTC1668IG) to identify single-event effects. In particular, it was studied the detection of single-event latch-up (SEL), single-event upsets (SEU), and single-event transients (SET) due to heavy-ions radiation. The tests were performed at the heavy-ion facility Tandem-ALPI at INFN Legnaro National Laboratory (Italy) in February 2021 and June 2022 for a total irradiation time of ~51 hours

Fast neutron production at the LNL Tandem from the 7^7Li(14^{14}N,xn)X reaction

Fast neutron beams are of relevance for many scientific and industrial applications. This paper explores fast neutron production using a TANDEM accelerator at the Legnaro National Laboratories, via an energetic ion beam (90 MeV $^{14}N$) onto a lithium target. The high energy models for nuclear collision of FLUKA foresee large neutron yields for reactions of this kind. The experiment aimed at validating the expected neutron yields from FLUKA simulations, using two separate and independent set-ups: one based on the multi-foil activation technique, and the other on the time of flight technique, by using liquid scintillator detectors. The results of the experiment show clear agreement of the measured spectra with the FLUKA simulations, both in the shape and the magnitude of the neutron flux at the measured positions. The neutron spectrum is centered around the 8 MeV range with mild tails, and a maximum neutron energy spanning up to 50 MeV. These advantageous results provide a starting point in the development of fast neutron beams based on high energy ion beams from medium-sized accelerator facilities

Characterization of Electronic Circuits with the SIRAD IEEM: Developments and First Results

When an energetic ion strikes a microelectronic device it induces current transients that may lead to a variety of undesirable Single Event Effects (SEE). An important part of the activity of the SIRAD heavy ion facility at the 15 MV Tandem accelerator of the INFN Laboratories of Legnaro (Italy) concerns SEE studies of microelectronic devices destined for radiation hostile environments. An axial Ion Electron Emission Microscope (IEEM) is working at the SIRAD irradiation facility. It is devised to provide a micrometric sensitivity map of Single Event Effects of an electronic device. The IEEM system reconstructs the positions of individual random ion impacts over a circular area of 180 µm diameter by imaging the ion-induced secondary electrons emitted from the target surface. A fast Data Acquisition system (DAQ) is used to reconstruct the X and Y coordinates and the temporal information of every ion impact. Any signal induced by the SEE in a generic DUT can be used to tag the IEEM reconstructed event. This information is then used to display a map of the regions of the DUT surface which are sensitive to the impinging ions. In this thesis we introduce the subject of the effects of ionizing radiation on microelectronics circuits and systems. We then describe in detail the IEEM system, especially how it was modified and improved during the period of our work. We present the results of an extensive study of the IEEM resolution and image distortions, performed using high statistics acquisitions obtained with a 241 MeV 79Br ion beam by means of a fast SDRAM-based ion induced single event detection system, specifically designed for this purpose. We also describe a new feature implemented in the DAQ system which enables the IEEM to perform Time Resolved Ion Beam Induced Charge Collection (TRIBICC) studies, and show preliminary results obtained studying a MOSFET power transistor. We also studied a digital microelectronic circuit (SOI-Imager Shift Register) in two steps: we measured the SEU cross-section with our broad-beam facility at SIRAD, and then used the IEEM to acquire a SEU sensitivity map. At present the resolution of the IEEM at SIRAD is not close to the theoretical one. In this thesis we also describe an extensive set of studies we performed to investigate the origin of the resolution degradation. The conclusions follow and close this work.Quando uno ione energetico colpisce un dispositivo microelettronico, induce impulsi di corrente che possono generare diversi Single Event Effect (SEE) indesiderati. Una parte importante dell'attività della facility di irraggiamento a ioni pesanti SIRAD, presso il tandem da 15 MV dei Laboratori Nazionali di Legnaro (Italia) dell'INFN, riguarda studi di SEE su dispositivi microelettronici destinati ad ambienti ostili per il livello delle radiazioni. Presso la facility di irraggiamento SIRAD, e' in funzione un Ion Electron Emission Microscope (IEEM). Esso e' concepito per generare mappe di sensibilità a Single Event Effect di un dispositivo elettronico, con risoluzione micrometrica: il sistema IEEM ricostruisce le posizioni degli impatti di singoli ioni distribuiti casualmente entro un'area di 180 µm di diametro, acquisendo gli elettroni secondari emessi dalla superficie del bersaglio colpita dallo ione. Un sistema di acquisizione veloce (DAQ) è utilizzato per ricostruire le coordinate X ed Y e l'informazione temporale di ogni impatto. Ogni segnale indotto da un SEE in un generico dispositivo sotto test può essere utilizzato per marcare gli eventi ricostruiti dal sistema. Queste informazioni sono in seguito utilizzate per generare una mappa delle aree della superficie del dispositivo che sono sensibili all'impatto ionico. In questa tesi introduciamo l'argomento degli effetti della radiazione ionizzante sui sistemi e i dispositivi microelettronici e in seguito descriviamo in dettaglio il sistema IEEM, soffermandoci in particolare sulle modifiche e le migliorie introdotte durante questo periodo di lavoro. Descriviamo un detector di singoli impatti ionici, basato su una SDRAM, con il quale abbiamo ottenuto acquisizioni ad alta statistica usando un un fascio di ioni 79Br da 241 MeV. Questi dati ci hanno consentito uno studio approfondito della risoluzione dell'IEEM e della distorsione dell'immagine generata. Descriviamo inoltre una nuova caratteristica implementata nel nostro sistema di acquisizione, che consente all'IEEM di effettuare analisi di Time Resolved Ion Beam Induced Charge Collection (TRIBICC), e illustriamo i risultati preliminari ottenuti studiando un transistor MOSFET di potenza. Abbiamo infine studiato un circuito microelettronico digitale (SOI-Imager Shift Register) in due fasi: dapprima e' stata misurata la sezione d'urto a SEU con la nostra facility di irraggiamento a fascio non focalizzato, e in seguito l'IEEM e' stato utilizzato per acquisire una mappa di sensibilità a SEU. Infine, verificato che allo stato attuale la risoluzione dell'IEEM presso SIRAD non e' vicina al valore teorico, in questo lavoro di tesi descriviamo la serie di studi approfonditi condotti al fine di indagare l'origine della degradazione della risoluzione

Embedded Model Control application to drag-free and satellite-to satellite tracking

This paper describes the realization of a generic simulator for formation flying satellites, and the design and application of Embedded Model Control (EMC) to the spacecraft control, as potentially applicable to a constellation of drag-free satellites. They can be employed for scientific purposes: here it is presented the Satellite-Satellite Interferometry (SSI) mission for the measurement of the Earth's gravitational field harmonics, which will follow the incoming gravimetric mission GOCE and the gravitational wave observatory LISA. The core drag-free controller (DFC) was partly validated by Preliminary Design Review of GOCE mission, and particular emphasize is given to the acceleration observer and to the command computation law. The measurement model and mission requirements are also presented, followed by the simulation results of the DFC, tuned ad-hoc in order to obtain accurate aiming targe

Nondestructive wood discrimination: FTIR – Fourier Transform Infrared Spectroscopy in the characterization of different wood species used for artistic objects

Wooden artifacts represent a significant component of past cultures. Successful conservation of wooden artifacts depends on the knowledge of wood structure and types. It is critical that conservators know the category of wood that they are treating in order to successfully conserve it. Recently, vibrational spectroscopy has been successfully applied to determine the chemical structure of wood and to characterize wood types. FTIR (Fourier Transform Infrared) is a useful nondestructive or micro-destructive analytical technique providing information about chemical bonding and molecular structure. Its application in the discrimination between softwoods (conifers) and hardwoods (broad-leafs) has already been reported. The aim of the present study was to investigate the potential of FTIR as a tool for the discrimination between different wood types belonging to the same genus. Three different hardwood species, namely poplar (Populus spp), lime (Tilia spp) and birch (Betula spp), were investigated by means of FTIR spectroscopy. The woods were first inspected using a light microscope to certify the wood essence types through micrographic and morphoanatomical features. The FTIR spectra in the 4000 cm[Formula: see text] to 450 cm[Formula: see text] region were recorded using a Perkin-Elmer Spectrum 100 spectrometer. To enhance the qualitative interpretation of the IR spectra, second derivatives of all spectra were calculated using the Spectrum software to separate superimposed bands and to extract fine spectral details. To obtain a comprehensive characterization, the essences under investigation were also analyzed by means of Raman Spectroscopy. Clear differences were found in the spectra of the three samples confirming FTIR to be a powerful tool for wood type discrimination