11 research outputs found
Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometer
Journal of Materials Research9102712-2716JMRE
Microwave dielectric relaxation of silicon crystals
Journal of Physics and Chemistry of Solids55111369-1373JPCS
Effect of surface structures upon ultrathin film interference fringes
Journal of Materials Research892315-2318JMRE
Vacuum pump coaxial probe system for measurement of dielectric properties of materials with smooth surfaces
10.1088/0957-0233/6/3/004Measurement Science and Technology63281-282MSTC