2 research outputs found
Reaction-Ball-Milling-Driven Surface Coating Strategy to Suppress Pulverization of Microparticle Si Anodes
In
this work, we report a novel reaction-ball-milling surface coating
strategy to suppress the pulverization of microparticle Si anodes
upon lithiation/delithiation. By energetically milling the partially
prelithiated microparticle Si in a CO<sub>2</sub> atmosphere, a multicomponent
amorphous layer composed of SiO<sub><i>x</i></sub>, C, SiC,
and Li<sub>2</sub>SiO<sub>3</sub> is successfully coated on the surface
of Si microparticles. The coating level strongly depends on the milling
reaction duration, and the 12 h milled prelithiated Si microparticles
(BM12h) under a pressure of 3 bar of CO<sub>2</sub> exhibit a good
conformal coating with 1.006 g cm<sup>–3</sup> of tap density.
The presence of SiC remarkably enhances the mechanical properties
of the SiO<sub><i>x</i></sub>/C coating matrix with an approximately
4-fold increase in the elastic modulus and the hardness values, which
effectively alleviates the global volume expansion of the Si microparticles
upon lithiation. Simultaneously, the existence of Li<sub>2</sub>SiO<sub>3</sub> insures the Li-ion conductivity of the coating layer. Moreover,
the SEI film formed on the electrode surface maintains relatively
stable upon cycling due to the remarkably suppressed crack and pulverization
of particles. These processes work together to allow the BM12h sample
to offer much better cycling stability, as its reversible capacity
remains at 1439 mAh g<sup>–1</sup> at 100 mA g<sup>–1</sup> after 100 cycles, which is nearly 4 times that of the pristine Si
microparticles (381 mAh g<sup>–1</sup>). This work opens up
new opportunities for the practical applications of micrometer-scale
Si anodes
The Mechanism of Electrolyte Gating on High‑<i>T</i><sub><i>c</i></sub> Cuprates: The Role of Oxygen Migration and Electrostatics
Electrolyte
gating is widely used to induce large carrier density
modulation on solid surfaces to explore various properties. Most of
past works have attributed the charge modulation to electrostatic
field effect. However, some recent reports have argued that the electrolyte
gating effect in VO<sub>2</sub>, TiO<sub>2</sub>, and SrTiO<sub>3</sub> originated from field-induced oxygen vacancy formation. This gives
rise to a controversy about the gating mechanism, and it is therefore
vital to reveal the relationship between the role of electrolyte gating
and the intrinsic properties of materials. Here, we report entirely
different mechanisms of electrolyte gating on two high-<i>T</i><sub><i>c</i></sub> cuprates, NdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> (NBCO) and Pr<sub>2–<i>x</i></sub>Ce<sub><i>x</i></sub>CuO<sub>4</sub> (PCCO), with
different crystal structures. We show that field-induced oxygen vacancy
formation in CuO chains of NBCO plays the dominant role, while it
is mainly an electrostatic field effect in the case of PCCO. The possible
reason is that NBCO has mobile oxygen in CuO chains, while PCCO does
not. Our study helps clarify the controversy relating to the mechanism
of electrolyte gating, leading to a better understanding of the role
of oxygen electro migration which is very material specific