8 research outputs found

    Risk assessment of metal vapor arcing

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    A method for assessing metal vapor arcing risk for a component is provided. The method comprises acquiring a current variable value associated with an operation of the component; comparing the current variable value with a threshold value for the variable; evaluating compared variable data to determine the metal vapor arcing risk in the component; and generating a risk assessment status for the component

    Metal Vapor Arcing Risk Assessment Tool

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    The Tin Whisker Metal Vapor Arcing Risk Assessment Tool has been designed to evaluate the risk of metal vapor arcing and to help facilitate a decision toward a researched risk disposition. Users can evaluate a system without having to open up the hardware. This process allows for investigating components at risk rather than spending time and money analyzing every component. The tool points to a risk level and provides direction for appropriate action and documentation

    Method of manufacturing carbon nanotubes

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    A process for manufacturing carbon nanotubes, including a step of inducing electrical current through a carbon anode and a carbon cathode under conditions effective to produce the carbon nanotubes, wherein the carbon cathode is larger than the carbon anode. Preferably, a welder is used to induce the electrical current via an arc welding process. Preferably, an exhaust hood is placed on the anode, and the process does not require a closed or pressurized chamber. The process provides high-quality, single-walled carbon nanotubes, while eliminating the need for a metal catalyst

    An Examination of Environment Perturbation Effects on Single Event Upset Rates

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    This paper presents an analysis of the sensitivity of single event upset (SEU) rate predictions to changes in the direct ionization-inducing environment. An examination based on the nature of the SEU rate equation is presented for the case in which the perturbation is constant across varying particle linear energy transfer (LET). It is shown that the relative variation in SEU rate is equal to the relative perturbation in flux. Results are also presented for the case in which the environment perturbations exist in small LET bins. Through this analysis it is shown that the relative variation in expected SEU rate is equal to that in flux only for the LET regime in which the product of the cross section and differential flux is maximum

    Qualification and Issues with Space Flight Laser Systems and Components

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    The art of flight quality solid-state laser development is still relatively young, and much is still unknown regarding the best procedures, components, and packaging required for achieving the maximum possible lifetime and reliability when deployed in the harsh space environment. One of the most important issues is the limited and unstable supply of quality, high power diode arrays with significant technological heritage and market lifetime. Since Spectra Diode Labs Inc. ended their involvement in the pulsed array business in the late 199O's, there has been a flurry of activity from other manufacturers, but little effort focused on flight quality production. This forces NASA, inevitably, to examine the use of commercial parts to enable space flight laser designs. System-level issues such as power cycling, operational derating, duty cycle, and contamination risks to other laser components are some of the more significant unknown, if unquantifiable, parameters that directly effect transmitter reliability. Designs and processes can be formulated for the system and the components (including thorough modeling) to mitigate risk based on the known failures modes as well as lessons learned that GSFC has collected over the past ten years of space flight operation of lasers. In addition, knowledge of the potential failure modes related to the system and the components themselves can allow the qualification testing to be done in an efficient yet, effective manner. Careful test plan development coupled with physics of failure knowledge will enable cost effect qualification of commercial technology. Presented here will be lessons learned from space flight experience, brief synopsis of known potential failure modes, mitigation techniques, and options for testing from the system level to the component level

    Failure Analysis Study and Long-Term Reliability of Optical Assemblies with End-Face Damage

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    In June 2005, the NESC received a multi-faceted request to determine the long term reliability of fiber optic termini on the ISS that exhibited flaws not manufactured to best workmanship practices. There was a lack of data related to fiber optic workmanship as it affects the long term reliability of optical fiber assemblies in a harsh environment. A fiber optic defect analysis was requested which would find and/or create various types of chips, spalls, scratches, etc., that were identified by the ISS personnel. Once the defects and causes were identified the next step would be to perform long term reliability testing of similar assemblies with similar defects. The goal of the defect analysis would be for the defects to be observed and documented for deterioration of fiber optic performance. Though this report mostly discusses what has been determined as evidence of poor manufacturing processes, it also concludes the majority of the damage could have been avoided with a rigorous process in place

    NESC Independent Review of the Mars Reconnaissance Orbiter (MRO) Contamination Thermal/Vacuum (T/V) Anomaly Technical Consultation Report

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    The NESC eras requested by the NASA Jet Propulsion Laboratory (JPL) to conduct an independent review of the Mars Reconnaissance Orbiter (MRO) Thermal/Vacuum (T/V) Anomaly Assessment. Because the anomaly resulted in the surface contamination of the MRO, selected members of the Materials Super Problem Resolution Team (SPRT) and the NASA technical community having technical expertise relative to contamination issues were chosen for the independent review. The consultation consisted of a review of the MRO Project's reported response to the assessment findings, a detailed review of JPL technical assessment final report, and detailed discussions with the JPL assessment team relative to their findings
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