55 research outputs found
Branching Interfaces with Infinitely Strong Couplings
A hierarchical froth model of the interface of a random -state Potts
ferromagnet in is studied by recursive methods. A fraction of the
nearest neighbour bonds is made inaccessible to domain walls by infinitely
strong ferromagnetic couplings. Energetic and geometric scaling properties of
the interface are controlled by zero temperature fixed distributions. For
, the directed percolation threshold, the interface behaves as for
, and scaling supports random Ising () critical behavior for all
's. At three regimes are obtained for different ratios of ferro vs.
antiferromagnetic couplings. With rates above a threshold value the interface
is linear ( fractal dimension ) and its energy fluctuations,
scale with length as , with .
When the threshold is reached the interface branches at all scales and is
fractal () with . Thus, at ,
dilution modifies both low temperature interfacial properties and critical
scaling. Below threshold the interface becomes a probe of the backbone geometry
(\df\simeq{\bar d}\simeq 1.305; = backbone fractal dimension ),
which even controls energy fluctuations ().
Numerical determinations of directed percolation exponents on diamond
hierarchical lattice are also presented.Comment: 16 pages, 3 Postscript figure
First order wetting of rough substrates and quantum unbinding
Replica and functional renormalization group methods show that, with short
range substrate forces or in strong fluctuation regimes, wetting of a
self-affine rough wall in 2D turns first-order as soon as the wall roughness
exponent exceeds the anisotropy index of bulk interface fluctuations. Different
thresholds apply with long range forces in mean field regimes. For
bond-disordered bulk, fixed point stability suggests similar results, which
ultimately rely on basic properties of quantum bound states with asymptotically
power-law repulsive potentials.Comment: 11 pages, 1 figur
The Unusual Universality of Branching Interfaces in Random Media
We study the criticality of a Potts interface by introducing a {\it froth}
model which, unlike its SOS Ising counterpart, incorporates bubbles of
different phases. The interface is fractal at the phase transition of a pure
system. However, a position space approximation suggests that the probability
of loop formation vanishes marginally at a transition dominated by {\it strong
random bond disorder}. This implies a linear critical interface, and provides a
mechanism for the conjectured equivalence of critical random Potts and Ising
models.Comment: REVTEX, 13 pages, 3 Postscript figures appended using uufile
Branching Transition of a Directed Polymer in Random Medium
A directed polymer is allowed to branch, with configurations determined by
global energy optimization and disorder. A finite size scaling analysis in 2D
shows that, if disorder makes branching more and more favorable, a critical
transition occurs from the linear scaling regime first studied by Huse and
Henley [Phys. Rev. Lett. 54, 2708 (1985)] to a fully branched, compact one. At
criticality clear evidence is obtained that the polymer branches at all scales
with dimension and roughness exponent satisfying , and energy fluctuation exponent , in terms of longitudinal distanceComment: REVTEX, 4 pages, 3 encapsulated eps figure
Finite Size Scaling Analysis of Biased Diffusion on Fractals
Diffusion on a T fractal lattice under the influence of topological biasing
fields is studied by finite size scaling methods. This allows to avoid
proliferation and singularities which would arise in a renormalization group
approach on infinite system as a consequence of logarithmic diffusion. Within
the scheme, logarithmic diffusion is proved on the basis of an analysis of
various temporal scales such as first passage time moments and survival
probability characteristic time. This confirms and puts on firmer basis
previous renormalization group results. A careful study of the asymptotic
occupation probabilities of different kinds of lattice points allows to
elucidate the mechanism of trapping into dangling ends, which is responsible
of the logarithmic time dependence of average displacement.Comment: 17 pages TeX, 3 Postscript figure
Recent Trends and Perspectives on Defect-Oriented Testing
Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test
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