5 research outputs found
Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
Electro-optic LiNbO3 thin films were deposited on Si(100) and Si(111) substrates using a radio-frequency magnetron sputtering process. The piezoelectric properties of the LiNbO3 films were investigated using the scanning probe microscopy in the piezoresponse mode. The obtained results show the high degree of grains orientation in polycrystalline structure. The piezoelectric modulus (dzz) was estimated to be 16 pm/V (for LiNbO3 / Si(100)) and 22 pm/V (for LiNbO3 / Si(111)) and the polarization about of 0.37 CΒ·m β 2. These values are larger than those reported previously for LiNbO3 films.
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Formation of the Electric Field Distribution in Thin Electro-Optic Layers for Precision Correction their Optical Characteristics
A method of making given field distribution within thin electro-optical layers by using narrow band electrodes placed at the same electric potential. A formula for electric field intensity produced by a single band electrode is obtained. Electric field modeling for different band electrode configurations is undertaken. It was shown, by applying piezoresponse force microscopy, that in case of highly inhomogeneous field the polarization of lithium niobate electro-optical film persisted only in the area above
the band electrode.
Lithium niobate, electro-optical structures, piezoresponse force microscopy, Computer
simulation
Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
LiNbO3 thin films were deposited on Al2O3 substrates by RF-magnetron sputtering with in-situ electric
field to study the self-polarization effect. The films have been characterized crystallographically by x-ray
diffraction, and morphologically by atomic force microscopy. The films contain crystallites of LiNbO3 with
preferable orientation [012] along the normal to the Al2O3 substrate surface (012). Piezoresponse force
microscopy was used to study vertical and lateral polarization direction in LiNbO3 thin films. The analysis
of the histograms of vertical piezoresponse images allowed to reveal self-polarization effect in films. The
local piezoelectric hysteresis performed on the nanometer scale indicates switching behavior of polarization
for LiNbO3 thin film
Formation of the Electric Field Distribution in Thin Electro-Optic Layers for Precision Correction their Optical Characteristics
A method of making given field distribution within thin electro-optical layers by using narrow band electrodes placed at the same electric potential. A formula for electric field intensity produced by a single band electrode is obtained. Electric field modeling for different band electrode configurations is undertaken. It was shown, by applying piezoresponse force microscopy, that in case of highly inhomogeneous field the polarization of lithium niobate electro-optical film persisted only in the area above
the band electrode.
Lithium niobate, electro-optical structures, piezoresponse force microscopy, Computer
simulation
Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
LiNbO3 thin films were deposited on Al2O3 substrates by RF-magnetron sputtering with in-situ electric
field to study the self-polarization effect. The films have been characterized crystallographically by x-ray
diffraction, and morphologically by atomic force microscopy. The films contain crystallites of LiNbO3 with
preferable orientation [012] along the normal to the Al2O3 substrate surface (012). Piezoresponse force
microscopy was used to study vertical and lateral polarization direction in LiNbO3 thin films. The analysis
of the histograms of vertical piezoresponse images allowed to reveal self-polarization effect in films. The
local piezoelectric hysteresis performed on the nanometer scale indicates switching behavior of polarization
for LiNbO3 thin film