2 research outputs found
Wheat yield sensitivity to climate change across a European transect for a large ensemble of crop models
The sensitivity of a 26 member ensemble of process
based wheat simulation models to perturbations in
baseline temperature and precipitation was examined to construct impact response surfaces (IRS) of simulated yields
Kleines Mikroelektronik-Lexikon: wichtige Abkuerzungen u. Begriffe verstaendl. erklaert ; entwickelt fuer Fuehrungskraefte-Seminare Management u. Mikroelektronik
Available from Bibliothek des Instituts fuer Weltwirtschaft, ZBW, Duesternbrook Weg 120, D-24105 Kiel C 145638 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLE2. enl. and rev. ed.DEGerman