150 research outputs found

    Draft INFL Guideline on SIMS

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    Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples. The greatest strength of SIMS is the ability to analyze very small areas (as small as 50 nm using the CAMECA NanoSIMS, for example) and to generate high-spatial resolution maps of the distribution of elements and isotopes within the sample. The measurement of the isotopic composition of sample is usually straightforward, only requiring the analysis of the sample and that of an isotopic reference material for determination of the mass bias of the instrument. Quantification of elements, however, involves the analysis of matrix matched standards for the determination of the relative sensitivity factor (a function of both the element to be analyzed and the matrix). SIMS is commonly used in nuclear forensics for exploring the heterogeneity of the material on fine spatial scale

    Action Sheet 36 Final Report

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    Pursuant to the Arrangement between the European Commission DG Joint Research Centre (EC-JRC) and the Department of Energy (DOE) to continue cooperation on research, development, testing, and evaluation of technology, equipment, and procedures in order to improve nuclear material control, accountancy, verification, physical protection, and advanced containment and surveillance technologies for international safeguards, dated 1 September 2008, the IRMM and LLNL established cooperation in a program on the Study of Chemical Changes in Uranium Oxyfluoride Particles under IRMM-LLNL Action Sheet 36. The work under this action sheet had 2 objectives: (1) Achieve a better understanding of the loss of fluorine in UO{sub 2}F{sub 2} particles after exposure to certain environmental conditions; and (2) Provide feedback to the EC-JRC on sample reproducibility and characteristics
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