X-ray diffracted intensity for double reflection channel cut Ge monochromators at extremely asymmetric diffraction conditions

The width and the integrated intensity of the 220 x-ray double diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel cut Ge crystal in an angular range near the critical angle of total external reflection. The Bragg angle and incidence condition were varied by changing the x-ray energy. In agreement with the extended dynamical theory of x-ray diffraction, the integrated intensity of the double diffraction remained almost constant even for grazing incidence condition very close to the critical angle C for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of x-ray diffraction was observed when the Bragg condition was at angles of incidence lower than 0.6?. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 degrees due to the etching to remove the cutting damage and the increasing effect of refraction at glancing angles close to the critical angle. These findings confirm that highly asymmetric channel cut Ge crystals can work as efficient monochromators or image magnifiers also at glancing angles close to the critical angle and that the main limitation is the crystal surface preparation

Development of crystal optics for Multi-Projection X-ray Imaging for synchrotron and XFEL sources

X-ray Multi-Projection Imaging (XMPI) is an emerging technology that allows for the acquisition of millions of 3D images per second in samples opaque to visible light. This breakthrough capability enables volumetric observation of fast stochastic phenomena, which were inaccessible due to the lack of a volumetric X-ray imaging probe with kHz to MHz repetition rate. These include phenomena of industrial and societal relevance such as fractures in solids, propagation of shock waves, laser-based 3D printing, or even fast processes in the biological domain. Indeed, the speed of traditional tomography is limited by the shear forces caused by rotation, to a maximum of 1000 Hz in state-of-the-art tomography. Moreover, the shear forces can disturb the phenomena in observation, in particular with soft samples or sensitive phenomena such as fluid dynamics. XMPI is based on splitting an X-ray beam to generate multiple simultaneous views of the sample, therefore eliminating the need for rotation. The achievable performances depend on the characteristics of the X-ray source, the detection system, and the X-ray optics used to generate the multiple views. The increase in power density of the X-ray sources around the world now enables 3D imaging with sampling speeds in the kilohertz range at synchrotrons and megahertz range at X-ray Free-Electron Lasers (XFELs). Fast detection systems are already available, and 2D MHz imaging was already demonstrated at synchrotron and XFEL. In this work, we explore the properties of X-ray splitter optics and XMPI schemes that are compatible with synchrotron insertion devices and XFEL X-ray beams. We describe two possible schemes designed to permit large samples and complex sample environments. Then, we present experimental proof of the feasibility of MHz-rate XMPI at the European XFEL.Comment: 47 pages, 17 figure