16 research outputs found
メチレンブルーの不均一光触媒分解反応における磁場効果
京都大学0048新制・課程博士博士(エネルギー科学)甲第16417号エネ博第239号新制||エネ||52(附属図書館)29048京都大学大学院エネルギー科学研究科エネルギー社会・環境科学専攻(主査)教授 石原 慶一, 教授 尾形 幸生, 准教授 奥村 英之学位規則第4条第1項該当Doctor of Energy ScienceKyoto UniversityDA
Effect of grain boundary character of multicrystalline Si on external and internal (phosphorus) gettering of impurities
Towards implementation of floating cast method for growing large-scale high-quality multicrystalline silicon ingot using designed double crucibles
Imaging Surface Recombination Velocities of Grain Boundaries in Multicrystalline Silicon Wafers via Photoluminescence
Distribution and propagation of dislocation defects in quasi-single crystalline silicon ingots cast by the directional solidification method
Enhanced Phosphorus Gettering of Impurities in Multicrystalline Silicon at Low Temperature
Effect of Static Magnetic Field on Photocatalytic Degradation of Methylene Blue over ZnO and TiO2 Powders
Electronic Quality Improvement of Highly Defective Quasi-Mono Silicon Material by Phosphorus Diffusion Gettering
Quasi-mono silicon (QM-Si) attracts interest as a substrate material for silicon device processing with the promise to yield single-crystalline silicon quality with multicrystalline silicon cost. A significant barrier to widespread implementation of QM-Si is ingot edge-contamination caused by the seed material and crucible walls during crystal growth. This work aims to recover the scrap material in QM-Si manufacturing with a process easily adaptable to semiconductor device manufacturing. A phosphorus diffusion process at 870 °C for 60 min significantly improves the electronic quality of a QM-Si wafer cut from a contaminated edge brick. The harmonic minority carrier recombination lifetime of the wafer, a key predictor of ultimate device performance, experiences a tenfold increase from 17 to 178 μs, which makes the scrap QM-Si material usable for device fabrication. Local areas with suboptimal (<50 μs) lifetimes remaining can be further improved by a high temperature anneal before the phosphorus diffusion process.Peer reviewe