11 research outputs found

    Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool

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    Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 - August 2, 201

    A New SEM Column Combining Ultra-High Resolution and Flexible Scanning

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    Vybrane metody odhadu rizika.

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    Available from STL, Prague, CZ / NTK - National Technical LibrarySIGLECZCzech Republi

    Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam

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    New Ultra-High Resolution SEM for Imaging by Low Energy Electrons

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    Combined plasma FIB-SEM

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    Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool

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