2 research outputs found
Multifunctional Homogeneous Lateral Black Phosphorus Junction Devices
We
demonstrate a controllable doping technique of few-layer black
phosphorus (BP) via surface charge transfer using an ionic liquid
mixture of EMIMÂ(C<sub>6</sub>H<sub>11</sub>N<sub>2</sub><sup>+</sup>):TFSIÂ(C<sub>2</sub>F<sub>6</sub>NO<sub>4</sub>S<sub>2</sub><sup>–</sup>) [EMIM:TFSI, 1-ethyl-3-methylimidazolium bisÂ(trifluoromethanesulfonyl)
imide]. A wide range of hole carrier densities, from 10<sup>11</sup> cm<sup>–2</sup> (nondegenerate) to 10<sup>13</sup> cm<sup>–2</sup> (degenerate), can be obtained by controlling the
weight percentage of the ionic liquid mixture. The doping method we
proposed in this paper can be applied to make a multifunctional homogeneous
lateral p–n junction device. By doping a fraction of the BP
sample and by applying a gate voltage to the other fraction of the
BP, we obtain homogeneous lateral p<sup>+</sup>–p, p<sup>+</sup>–n, p<sup>+</sup>–n<sup>+</sup> junction diodes in
a single BP channel. The homogeneous lateral BP p<sup>+</sup>–p
and p<sup>+</sup>–n junctions display ideal rectifying behavior
and a much stronger photoresponse due to the built-in potential. Furthermore,
at high positive gate voltages, the interband tunneling enables the
homogeneous lateral p<sup>+</sup>–n<sup>+</sup> junction transistors
to provide both a negative differential resistance (NDR) and a negative
transconductance (NTC) in the current–voltage characteristics
at room temperature. On the basis of our results, it is possible to
build novel devices utilizing the large NDR and NTC in BP such as
amplifiers, oscillators, and multivalued logic systems
Plasma-Treated Thickness-Controlled Two-Dimensional Black Phosphorus and Its Electronic Transport Properties
We report the preparation of thickness-controlled few-layer black phosphorus (BP) films through the modulated plasma treatment of BP flakes. Not only does the plasma treatment control the thickness of the BP film, it also removes the chemical degradation of the exposed oxidized BP surface, which results in enhanced field-effect transistor (FET) performance. Our fabricated BP FETs were passivated with poly(methyl methacrylate) (PMMA) immediately after the plasma etching process. With these techniques, a high field-effect mobility was achieved, 1150 cm<sup>2</sup>/(V s), with an <i>I</i><sub>on</sub>/<i>I</i><sub>off</sub> ratio of ∼10<sup>5</sup> at room temperature. Furthermore, a fabricated FET with plasma-treated few-layer BP that was passivated with PMMA was found to retain its <i>I</i>–<i>V</i> characteristics and thus to exhibit excellent environmental stability over several weeks