A general software defect-proneness prediction framework

This is the author's accepted manuscript. The final published article is available from the link below. Copyright @ 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.BACKGROUND - Predicting defect-prone software components is an economically important activity and so has received a good deal of attention. However, making sense of the many, and sometimes seemingly inconsistent, results is difficult. OBJECTIVE - We propose and evaluate a general framework for software defect prediction that supports 1) unbiased and 2) comprehensive comparison between competing prediction systems. METHOD - The framework is comprised of 1) scheme evaluation and 2) defect prediction components. The scheme evaluation analyzes the prediction performance of competing learning schemes for given historical data sets. The defect predictor builds models according to the evaluated learning scheme and predicts software defects with new data according to the constructed model. In order to demonstrate the performance of the proposed framework, we use both simulation and publicly available software defect data sets. RESULTS - The results show that we should choose different learning schemes for different data sets (i.e., no scheme dominates), that small details in conducting how evaluations are conducted can completely reverse findings, and last, that our proposed framework is more effective and less prone to bias than previous approaches. CONCLUSIONS - Failure to properly or fully evaluate a learning scheme can be misleading; however, these problems may be overcome by our proposed framework.National Natural Science Foundation of Chin

Vacuum induced Berry phases in single-mode Jaynes-Cummings models

Motivated by the work [Phys. Rev. Lett. 89, 220404 (2002)] for detecting the vacuum-induced Berry phases with two-mode Jaynes-Cummings models (JCMs), we show here that, for a parameter-dependent single-mode JCM, certain atom-field states also acquire the photon-number-dependent Berry phases after the parameter slowly changed and eventually returned to its initial value. This geometric effect related to the field quantization still exists, even the filed is kept in its vacuum state. Specifically, a feasible Ramsey interference experiment with cavity quantum electrodynamics (QED) system is designed to detect the vacuum-induced Berry phase.Comment: 10 pages, 4 figures

Spatio-temporal mapping of variation potentials in leaves of Helianthus annuus L. seedlings in situ using multi-electrode array.

Damaging thermal stimuli trigger long-lasting variation potentials (VPs) in higher plants. Owing to limitations in conventional plant electrophysiological recording techniques, recorded signals are composed of signals originating from all of the cells that are connected to an electrode. This limitation does not enable detailed spatio-temporal distributions of transmission and electrical activities in plants to be visualised. Multi-electrode array (MEA) enables the recording and imaging of dynamic spatio-temporal electrical activities in higher plants. Here, we used an 8 × 8 MEA with a polar distance of 450 μm to measure electrical activities from numerous cells simultaneously. The mapping of the data that were recorded from the MEA revealed the transfer mode of the thermally induced VPs in the leaves of Helianthus annuus L. seedlings in situ. These results suggest that MEA can enable recordings with high spatio-temporal resolution that facilitate the determination of the bioelectrical response mode of higher plants under stress