Over 10% efficient wide bandgap CIGSe solar cells on transparent substrate with Na predeposition treatment

With the recent rise of new photovoltaic applications, it has become necessary to develop specific optoelectronic properties for thin-film technologies such as Cu(In,Ga)Se2 and to take advantage of their high degree of tunability. The feasibility of efficient wide bandgap absorbers on transparent conductive oxide substrates is, in that context, of critical importance. Using an original approach based on a predeposition sodium treatment, Cu(In,Ga)Se2 absorbers fabricated by sputtering and reactive annealing with a Ga to (Ga + In) content over 0.7 and an optical bandgap above 1.4 eV are deposited on transparent fluorine-doped tin oxide films, with the insertion of an ultrathin MoSe2 layer preserving the contact's ohmicity. Different material characterizations are carried out, and a thorough Raman analysis of the absorber reveals that the sodium pretreatment significantly enhances the Ga incorporation into the chalcopyrite matrix, along with markedly improving the film's morphology and crystalline quality. This translates to a spectacular boost of the photovoltaic performance for the resulting solar cell as compared with a reference device without Na, specifically in the voltage and fill factor. Eventually, an efficiency exceeding 10% is obtained without antireflection coating, a record value bridging the gap with the state of the art on nontransparent substrates.Peer ReviewedPostprint (author's final draft

Challenges and improvement pathways to develop quasi-1D (Sb1-xBix)2Se3-based materials for optically tuneable photovoltaic applications. Towards chalcogenide narrow-bandgap devices

Quasi-1D chalcogenides have shown great promises in the development of emerging photovoltaic technologies. However, most quasi-1D semiconductors other than Sb2Se3 and Sb2S3 have been seldom investigated for energy generation applications. Indeed, cationic or anionic alloying strategies allow changing the bandgap of these materials, opening the door to the development of an extended range of chalcogenides with tuneable optical and electrical properties. In this work, Bi incorporation into the Sb2Se3 structure has been proved as an effective approach to modulate the bandgap between 0.1. In order to better understand the underlying mechanisms leading to the formation of (Sb1-xBix)2Se3, and thus design specific strategies to enhance its properties, thin films with different annealing time and temperature have been synthesized and characterized. Interestingly, it has been observed that Sb2Se3 and Bi2Se3 are formed first, with Bi melting at 300 ¿C and diffusing rapidly towards the surface of the film. At higher temperature, the binary compounds combine to form the solid solution, however as the dwell time increases, (Sb1-xBix)2Se3 decomposes again into Bi2Se3 and Sb. This study has shown that the material is essentially limited by compositional disorder and recombination via defects. Likewise, routes have been proposed to improve morphology and uniformity of the layer, achieving efficiencies higher than 1% for x > 0.2Postprint (published version

Perfil en profundidad de defectos en absorbedores de kesterita a través de un ataque químico y análisis superficial

A method to probe the depth morphology, defect profile and possible secondary phases in a thin film semiconductor is presented, taking a standard Kesterite film as an example. Using a top-down approach based on a previously reported controlled Methanol-Br2 chemical etching, well-defined slabs of a state of the art Kesterite absorber are fabricated. The analysis of their morphology both by Scanning Electron Microscopy and 3D optical Profilometry reveals the extent of a previously reported poor film morphology toward the back interface, and we are able to determine that more than 50% of a standard absorber is disconnected from the substrate. More importantly, these etched films are subsequently analyzed by surface sensitive techniques such as X-ray Photoelectron Spectroscopy and UV-Raman analysis. An accurate composition profile is established, and for the first time, a direct observation of the defects’ nature and their depth profiling in Kesterite is made possible. While VCu are found with a constant amount throughout the absorber, indicating a homogenous carrier concentration, a prevalence of the ZnSn defect is observed with a steep gradient toward the back interface, associated with an increase in the SnSe2 secondary phase. With bulk defects being often pointed out as the intrinsic limitation of this material, this result highlights what possibly is the main impediment of Kesterite solar cells, and a critical point to address in the design of future devices. Beyond the case of Kesterite absorbers, the method presented here offers a combination of simplicity, tunability and versatility making a straightforward transfer to other emerging thin film absorbers feasible, and it could possibly be an important tool in their future performance assessment and comparison.Peer ReviewedPostprint (author's final draft