4 research outputs found
Split-off dimer defects on the Si(001)2x1 surface
Dimer vacancy (DV) defect complexes in the Si(001)2x1 surface were
investigated using high-resolution scanning tunneling microscopy and first
principles calculations. We find that under low bias filled-state tunneling
conditions, isolated 'split-off' dimers in these defect complexes are imaged as
pairs of protrusions while the surrounding Si surface dimers appear as the
usual 'bean-shaped' protrusions. We attribute this to the formation of pi-bonds
between the two atoms of the split-off dimer and second layer atoms, and
present charge density plots to support this assignment. We observe a local
brightness enhancement due to strain for different DV complexes and provide the
first experimental confirmation of an earlier prediction that the 1+2-DV
induces less surface strain than other DV complexes. Finally, we present a
previously unreported triangular shaped split-off dimer defect complex that
exists at SB-type step edges, and propose a structure for this defect involving
a bound Si monomer.Comment: 8 pages, 7 figures, submitted to Phys. Rev.