57 research outputs found

    Reflection Anistropy Spectroscopy Study of the Near Surface Electric Field in Low-Temperature Grown GaAs (001)

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    We have evaluated an ‘‘effective depletion width’’ of =\u3c 45 Å and the sign (n-type/upward band bending) of the near surface electric field in low-temperature grown GaAs ~001! using the optical method of reflection anisotropy spectroscopy in the vicinity of the spin-orbit split E1 , E1 + Delta1 optical features. Our results provide evidence that surface Fermi level pinning occurs for air exposed (001) surfaces of undoped low temperature grown GaAs

    Measurement of the band offsets between amorphous LaAlO3 and silicon

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    The conduction and valence band offsets between amorphous LaAlO3 and silicon have been determined from x-ray photoelectron spectroscopy measurements. These films, which are free of interfacial SiO2, were made by molecular-beam deposition. The band line-up is type I with measured band offsets of 1.8+/-0.2 eV for electrons and 3.2+/-0.1 eV for holes. The band offsets are independent of the doping concentration in the silicon substrate as well as the amorphous LaAlO3 film thickness. These amorphous LaAlO3 films have a bandgap of 6.2+/-0.1 eV. (C) 2004 American Institute of Physics

    Growth and properties of epitaxial rare-earth scandate thin films

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    Epitaxial rare-earth scandate thin films of 100-1500 nm in thickness have been prepared by pulsed laser deposition on SrTiO3(100) and MgO(100) substrates. Stoichiometry and crystallinity were investigated by Rutherford backscattering spectrometry/channelling (RBS/C), transmission electron microscopy, and X-ray diffraction. Electrical measurements on microstructured capacitors with a SrRuO3 bottom electrode and Au top contacts reveal dielectric constants of 20 to 27, leakage currents of 0.85 to 6 mu A/cm(2) at 250 kV/cm, and breakdown fields of 0.6 to 1.2 MV/cm. The optical bandgaps of the films range from 5.5 to 6 eV. The results substantiate the high potential of rare-earth scandates as alternative gate oxides

    Rare-earth scandate single- and multi-layer thin films as alternative gate oxides for microelectronic applications

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    Thin films of rare-earth scandates (REScO3) as well as multi-layers of scandates and titanates have been prepared using pulsed laser deposition. Epitaxial films were grown on SrRuO3/SrTiO3(100) as well as amorphous films on silicon substrates. The epitaxial films are investigated to measure the physical properties of the crystalline material. Electrical measurements (CV, leakage current) show for example high epsilon(r) > 20 for the scandates and epsilon(r) > 35 for the epitaxial and amorphous multi-layer films. A diffusion of the new materials into silicon is not observed
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