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1 research outputs found
Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components
Author
Association Connecting Electronics Industries (IPC)
Casasnovas
+47Â more
Diganta Das
EIAJ ED04701/300-1
Electric Power Research Institute (EPRI)
EPCOS
Fujitsu Semiconductor Europe
Galloway
Gasperi
International Electrotechincal Commission (IEC)
Kitano
Kulkarni
Lee
Li
Li
Madsen
Manoharan
Manoharan
Manoharan
Manoharan
Manoharan
Manoharan
McCluskey
McCluskey
Nga Man Jennifa Li
NXP
Osterman
Park
Patel
Patrick McCluskey
Polcano
Pope
Shyamsundar
Society of Automotive Engineers (SAE)
Society of Automotive Engineers (SAE)
Society of Automotive Engineers (SAE)
Society of Automotive Engineers (SAE)
Solid State Technology Association (JEDEC)
Solid State Technology Association (JEDEC)/Association Connecting Electronics Industries (IPC)
Song
Sorensen
Stevens
Texas Instrument
U.S Department of Defense
Wang
Weast
Zhang
Zhang
Zhao
Publication venue
'Elsevier BV'
Publication date
Field of study
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Crossref
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