1 research outputs found
Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.Includes bibliographical references (p. 73).by Jonathan E. Howe.S.M