Atomic force microscopy for surface imaging and characterization of supported nanostructures

This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on AFM instrumentation. In particular, the frequency modulation method of the non-contact AFM (NC-AFM) used in ultra-high vacuum conditions is explained in detail. Then, applications of NC-AFM for an atomic-scale range characterization of semiconductor and isolator surfaces as well as supported nanostructures are introduced

Non-Standard Errors

In statistics, samples are drawn from a population in a data-generating process (DGP). Standard errors measure the uncertainty in sample estimates of population parameters. In science, evidence is generated to test hypotheses in an evidence-generating process (EGP). We claim that EGP variation across researchers adds uncertainty: non-standard errors. To study them, we let 164 teams test six hypotheses on the same sample. We find that non-standard errors are sizeable, on par with standard errors. Their size (i) co-varies only weakly with team merits, reproducibility, or peer rating, (ii) declines significantly after peer-feedback, and (iii) is underestimated by participants