Effect of substrate temperature on structural and morphological parameters of ZnTe thin films

Vacuum evaporated thin films of Zinc Telluride (ZnTe) of 5000 Å thickness have been deposited on glass substrates at different substrate temperatures (303 K, 373 K, 448 K). Structural parameters were obtained using XRD analysis. Atomic Force Microscope (AFM) in non-contact mode has been used to study the surface morphological properties of the deposited thin films. The results obtained from structural and surface morphological studies have been correlated and it is found that the films deposited at higher substrate temperatures possess increasingly good crystallinity and smoother surfaces. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/930