32 research outputs found
Simultaneously-Measured Mid-Infrared Refractive Indices of GaAs/AlGaAs
We present our results for a simultaneous measurement of the refractive
indices of Gallium Arsenide (GaAs) and Aluminum Gallium Arsenide
(AlGaAs) in the spectral region from to
( to ). These
values are obtained from a monocrystalline thin-film multilayer Bragg mirror of
excellent purity (background doping ), grown via molecular beam epitaxy. To recover the
refractive indices over such a broad wavelength range, we fit a dispersion
model for each material. For that, we measure both a photometrically accurate
transmittance spectrum of the Bragg mirror via Fourier-transform infrared
spectrometry and the individual physical layer thicknesses of the structure via
scanning electron microscopy. To infer the uncertainty of the refractive index
values, we estimate relevant measurement uncertainties and propagate them via a
Monte-Carlo-type method. This method conclusively yields propagated relative
uncertainties on the order of over the measured spectral range for
both GaAs and AlGaAs. The fitted model can also approximate
the refractive index for MBE-grown AlGaAs for . These updated values will be essential in the design and
fabrication of next-generation active and passive optical devices in a spectral
region which is of high interest in many fields, e.g., laser design and
cavity-enhanced spectroscopy.Comment: 20 pages, 5 figures, submitted to PR