Morphology of Graphene on SiC(000-1) Surfaces

Graphene is formed on SiC(000-1) surfaces (the so-called C-face of the crystal) by annealing in vacuum, with the resulting films characterized by atomic force microscopy, Auger electron spectroscopy, scanning Auger microscopy and Raman spectroscopy. Morphology of these films is compared with the graphene films grown on SiC(0001) surfaces (the Si-face). Graphene forms a terraced morphology on the C-face, whereas it forms with a flatter morphology on the Si-face. It is argued that this difference occurs because of differing interface structures in the two cases. For certain SiC wafers, nanocrystalline graphite is found to form on top of the graphene.Comment: Submitted to Applied Physics Letters; 9 pages, 3 figures; corrected the stated location of Raman G line for NCG spectrum, to 1596 cm^-

"It's cleaner, definitely": Collaborative Process in Audio Production.

Working from vague client instructions, how do audio producers collaborate to diagnose what specifically is wrong with a piece of music, where the problem is and what to do about it? This paper presents a design ethnography that uncovers some of the ways in which two music producers co-ordinate their understanding of complex representations of pieces of music while working together in a studio. Our analysis shows that audio producers constantly make judgements based on audio and visual evidence while working with complex digital tools, which can lead to ambiguity in assessments of issues. We show how multimodal conduct guides the process of work and that complex media objects are integrated as elements of interaction by the music producers. The findings provide an understanding how people currently collaborate when producing audio, to support the design of better tools and systems for collaborative audio production in the future

Dissipative and Dispersive Optomechanics in a Nanocavity Torque Sensor

Dissipative and dispersive optomechanical couplings are experimentally observed in a photonic crystal split-beam nanocavity optimized for detecting nanoscale sources of torque. Dissipative coupling of up to approximately $500$ MHz/nm and dispersive coupling of $2$ GHz/nm enable measurements of sub-pg torsional and cantilever-like mechanical resonances with a thermally-limited torque detection sensitivity of 1.2$\times 10^{-20} \text{N} \, \text{m}/\sqrt{\text{Hz}}$ in ambient conditions and 1.3$\times 10^{-21} \text{N} \, \text{m}/\sqrt{\text{Hz}}$ in low vacuum. Interference between optomechanical coupling mechanisms is observed to enhance detection sensitivity and generate a mechanical-mode-dependent optomechanical wavelength response.Comment: 11 pages, 6 figure