4 research outputs found

    Atomic force microscopy for surface imaging and characterization of supported nanostructures

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    This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on AFM instrumentation. In particular, the frequency modulation method of the non-contact AFM (NC-AFM) used in ultra-high vacuum conditions is explained in detail. Then, applications of NC-AFM for an atomic-scale range characterization of semiconductor and isolator surfaces as well as supported nanostructures are introduced

    The Role of Predation in Shaping Crocodilian Natural History

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    Achievements and Challenges in Sedimentary Basin Dynamics: A Review

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