9 research outputs found
The effect of self-affine fractal roughness of wires on atom chips
Atom chips use current flowing in lithographically patterned wires to produce
microscopic magnetic traps for atoms. The density distribution of a trapped
cold atom cloud reveals disorder in the trapping potential, which results from
meandering current flow in the wire. Roughness in the edges of the wire is
usually the main cause of this behaviour. Here, we point out that the edges of
microfabricated wires normally exhibit self-affine roughness. We investigate
the consequences of this for disorder in atom traps. In particular, we consider
how closely the trap can approach the wire when there is a maximum allowable
strength of the disorder. We comment on the role of roughness in future
atom--surface interaction experiments.Comment: 7 pages, 7 figure
Design optimization of an electrostatic MEMS actuator with low spring constant for an "Atom Chip"
peer reviewe
A three-dimensional electrostatic actuator with a locking mechanism for microcavities on atom chips
A micromachined three-dimensional electrostatic actuator that is optimized
for aligning and tuning optical microcavities on atom chips is presented.
The design of the 3D actuator is outlined in detail, and its characteristics are
verified by analytical calculations and finite element modelling.
Furthermore, the fabrication process of the actuation device is described and
preliminary fabrication results are shown. The actuation in the chip plane
which is used for mirror positioning has a working envelope of 17.5 µm. The design incorporates a unique locking mechanism which allows the out-of-plane actuation that is used for cavity tuning to be carried out once the in-plane actuation is completed. A maximum translation of 7 µm can be achieved in the out-of-plane direction
Integration of a tuneable optical micro-cavity for single atom detection on an atom chip
peer reviewe