The EISCAT meteor code

The EISCAT UHF system has the unique capability to determine meteor vector velocities from the head echo Doppler shifts measured at the three sites. Since even meteors spending a very short time in the common volume produce analysable events, the technique lends itself ideally to mapping the orbits of meteors arriving from arbitrary directions over most of the upper hemisphere. <br><br> A radar mode optimised for this application was developed in 2001/2002. A specially selected low-sidelobe 32-bit pseudo-random binary sequence is used to binary phase shift key (BPSK) the transmitted carrier. The baud-length is 2.4 μs and the receiver bandwidth is 1.6 MHz to accommodate both the resulting modulation bandwidth and the target Doppler shift. Sampling is at 0.6 μs, corresponding to 90-m range resolution. Target range and Doppler velocity are extracted from the raw data in a multi-step matched-filter procedure. For strong (SNR>5) events the Doppler velocity standard deviation is 100–150 m/s. The effective range resolution is about 30 m, allowing very accurate time-of-flight velocity estimates. On average, Doppler and time-of-flight (TOF) velocities agree to within about one part in 10<sup>3</sup>. Two or more targets simultaneously present in the beam can be resolved down to a range separation <300 m as long as their Doppler shifts differ by more than a few km/s

High resolution general purpose D-layer experiment for EISCAT incoherent scatter radars using selected set of random codes

International audienceThe ionospheric D-layer is a narrow bandwidth radar target often with a very small scattering cross section. The target autocorrelation function can be obtained by transmitting a series of relatively short coded pulses and computing the correlation between data obtained from different pulses. The spatial resolution should be as high as possible and the spatial side lobes of the codes used should be as small as possible. However, due to the short pulse repetition period (in the order of milliseconds) at any instant, the radar receives detectable scattered signals not only from the pulse illuminating the D-region but also from 3?5 ambiguous-range pulses, which makes it difficult to produce a reliable estimate near zero lag of the autocorrelation function. A new experimental solution to this measurement problem, using a selected set of 40-bit random codes with 4 µs elements giving 600 m spatial resolution is presented. The zero lag is approximated by dividing the pulse into two 20-bit codes and computing the correlation between those two pulses. The lowest altitudes of the E-layer are measured by dividing the pulse into 5 pieces of 8 bits, which allows for computation of 4 lags. In addition, coherent integration of data from four pulses is used for obtaining separately the autocorrelation function estimate for the lowest altitudes and in cases when the target contains structures with a long coherence time. Design details and responses of the experiment are given, and analysed test data are shown

Angle-Resolved Environmental X-Ray Photoelectron Spectroscopy: A New Laboratory Setup for Photoemission Studies at Pressures up to 0.4 Torr

The paper presents the development and demonstrates the capabilities of a new laboratory-based environmental X-ray photoelectron spectroscopy system incorporating an electrostatic lens and able to acquire spectra up to 0.4 Torr. The incorporation of a two-dimensional detector provides imaging capabilities and allows the acquisition of angle-resolved data in parallel mode over an angular range of 14° without tilting the sample. The sensitivity and energy resolution of the spectrometer have been investigated by analyzing a standard Ag foil both under high vacuum (10−8 Torr) conditions and at elevated pressures of N2 (0.4 Torr). The possibility of acquiring angle-resolved data at different pressures has been demonstrated by analyzing a silicon/silicon dioxide (Si/SiO2) sample. The collected angle-resolved spectra could be effectively used for the determination of the thickness of the native silicon oxide layer